High-steady-state multi-port PUF (Poly Urethane Foam) circuit

Abstract

The invention discloses a high-steady-state multi-port PUF (Poly Urethane Foam) circuit comprising a decoding circuit module, a PUF circuit unit array, a sense amplifier, a selector, a latch, a time sequence control circuit module and an FIFO (First Input First Output) circuit unit, wherein the decoding circuit module is connected with the PUF circuit unit array which is connected with the sense amplifier, the sense amplifier is connected with the selector which is connected with the latch, the latch is connected with the FIFO circuit unit, and the time sequence control circuit module is respectively connected with the decoding circuit module, the PUF circuit unit array, the sense amplifier, the selector and the latch, and the PUF circuit unit array comprises at least two PUF circuit units. The high-steady-state multi-port PUF circuit has the advantages that a plurality of keys are output in one access, the frequent visit of the PUF circuit can be avoided, the time is saved, and the circuit power consumption is lowered.

Description

technical field [0001] The invention relates to the technical field of chip PUF anti-counterfeiting, in particular to a high-steady-state multi-port PUF circuit. Background technique [0002] The Physical Unclonable Functions (PUF) proposed by Pappu in "Physical One-Way Functions" in March 2001 is unique and unclonable, and can be widely used as identity authentication and anti-counterfeiting means. The use of PUF technology on integrated chips was first proposed by researchers such as Gassend of the Massachusetts Institute of Technology. PUF technology is a "biological feature" identification technology in the field of chips, which can also be called "chip DNA" technology. It uses PUF circuits to extract process deviations (including oxide layer thickness, W / L And random ion doping and other factors), generate an infinite number of unique keys, these keys are unpredictable and arranged, and exist forever, even the chip manufacturer cannot imitate. The PUF circuit dynamica...

AI Technical Summary

Problems solved by technology

In addition, if the above-mentioned PUF circuit unit is applied to a multi-port PUF circuit, the noise margin of the PUF circuit unit will become smaller and smaller as the number of ports increases, so that the noise margin of the multi-port PUF circuit will also become smaller and smaller, so that The output result of the multi-port PUF circuit is easily disturbed by noise, the reliability and accuracy are very low, and the chip security performance is poor

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