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Testing method of intrinsic noise voltage of microphone and testing device of testing method

A technology of inherent noise and test method, applied in the direction of electrical components, etc., can solve the problems of complex test system, unsuitable for large-scale test occasions of factory lines, etc., and achieve the effect of simple test system, low test requirements, and low noise

Inactive Publication Date: 2012-10-03
AAC ACOUSTIC TECH (SHENZHEN) CO LTD +2
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AI Technical Summary

Problems solved by technology

[0006] The present invention provides a method for testing the inherent noise voltage of a microphone and the testing device in order to solve the deficiencies in the prior art that the test system is complex and not suitable for large-scale test occasions such as factory lines.

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  • Testing method of intrinsic noise voltage of microphone and testing device of testing method
  • Testing method of intrinsic noise voltage of microphone and testing device of testing method
  • Testing method of intrinsic noise voltage of microphone and testing device of testing method

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Embodiment Construction

[0013] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0014] The present invention starts from the principle of the inherent noise voltage test of the microphone, which requires that the sound-receiving surface of the microphone is not affected by any sound waves, so we start by cutting off the way for the sound waves to pass into the microphone. Since the sound wave is a mechanical wave, it must rely on the vibration of the elastic medium to propagate, and the air as the elastic medium is pumped out in the vacuum box, and the sound wave cannot propagate, which well isolates the interference of external environmental noise and makes the microphone diaphragm Atmospheric sound pressure is close to zero, which fully meets the theoretical test requirements.

[0015] In fact, when there is no sound wave on the diaphragm of the microphone, there will still be a certain noise voltage output, which is called the i...

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Abstract

The invention provides a testing method of intrinsic noise voltage of a microphone and a testing device of the testing method. The method comprises the following steps of: providing the microphone and a vacuum box; placing the microphone into the vacuum box; then pumping air in the vacuum box by using a vacuum pump to form a vacuum environment; providing a low-noise amplifier and feeding an output signal of the microphone to the low-noise amplifier by utilizing a sealed cable; providing a measuring instrument, wherein the measuring instrument receives an electric signal of the low-noise amplifier; and then, measuring the intrinsic noise voltage of the microphone. The method utilizes the vacuum box so that low-noise testing requirements are easy to realize; testing principle requirements are met and the size of the vacuum box is not influenced by an acoustic structure; and the vacuum box is designed according to the size of the microphone and the size of a testing system is extremely reduced, so that the testing system is simple and is suitable for occasions such as a production line, in which the noise is large and large-batch tests are required.

Description

【Technical field】 [0001] The invention relates to the field of testing the inherent noise voltage of a microphone. 【Background technique】 [0002] The measurement of the equivalent noise level and signal-to-noise ratio of the microphone mainly measures the inherent noise voltage and sensitivity of the microphone, but usually the sensitivity is relatively easy to measure, so the key point is to accurately measure the inherent noise voltage. [0003] The existing test method is to put the whole microphone into the anechoic chamber, feed the microphone output signal to the low-noise measurement amplifier with a sealed cable, measure the inherent noise voltage of the microphone, that is, add A weighting, and then calculate the equivalent noise level and signal-to-noise ratio. [0004] Since the inherent noise of the microphone is mainly caused by the thermal agitation of the diaphragm or the electrical noise of the active part, it is measured when the sound receiving surface of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04R29/00
Inventor 周琳张丽宏
Owner AAC ACOUSTIC TECH (SHENZHEN) CO LTD
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