Device and method for measuring radar reflection characteristic of plasma coating material
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- XIDIAN UNIV
- Publication Date
- 2012-12-05
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of microwave / radar detection, and relates to a device and method for measuring radar reflection characteristics of plasma-coated materials, which can be used to uniformly coat plasma on a material to be tested and measure its radar reflection characteristics. Background technique
[0002] As a special dispersion medium, plasma has unique absorption, reflection and scattering properties for electromagnetic waves, which is very different from various conventional materials. Generally, during the high-speed re-entry process of targets such as various spacecraft and warheads, plasma will be produced to cover itself due to friction and high temperature, and its surface is equivalent to a composite material covered with plasma, thereby changing the radar reflection characteristics of the target itself ( Usually to attenuate radar echoes). Therefore, the study of materials and target characteristics under plasma c...