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Device and method for measuring radar reflection characteristic of plasma coating material

A technology of plasma and radar reflection, applied in the direction of measuring devices, analyzing materials, and material analysis using radiation diffraction, etc., can solve the problems of non-arbitrary adjustment, non-adjustable plasma thickness, and non-coverage of plasma, etc., to achieve radar echo characteristics Measuring the Effect of Accurate, Uniform Plasma Coating

Active Publication Date: 2014-12-03
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] 1) Plasma cannot cover the surface of the material to be tested
The plasma generated by this type of device is located inside the vacuum chamber, and the front and rear are blocked by quartz observation windows, so the plasma inside cannot be coated on the surface of the material
[0016] 2) Plasma thickness is not adjustable
Under the effect of low pressure diffusion, the plasma in this type of device diffuses and fills the entire cavity evenly. The thickness of the plasma is determined by the inherent size of the cavity and cannot be adjusted arbitrarily.

Method used

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  • Device and method for measuring radar reflection characteristic of plasma coating material
  • Device and method for measuring radar reflection characteristic of plasma coating material
  • Device and method for measuring radar reflection characteristic of plasma coating material

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Experimental program
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Effect test

Embodiment 1

[0034] The radar reflection characteristic measurement device of plasma coating material, including: large area uniformly non-magnetized plasma generating unit 1, radar cross section measuring mechanism 2, microwave anechoic chamber 3, support rail 4, support slider 5, measured material plate 6 8. Wave-absorbing material 8, large-area uniform non-magnetized plasma generating unit 1. Radar cross section measuring mechanism 2 is fixed in the microwave anechoic chamber 3, large-area uniform non-magnetized plasma generating unit 1 is surrounded by a wave-absorbing material 8 in a space The absorbing material 8 has a window, so that the measured material plate 6 of the large-area uniform non-magnetized plasma generating unit 1 faces the radar cross section measuring mechanism 2 directly.

Embodiment 2

[0036] Reference figure 1 , Radar reflection characteristic measurement device of plasma coating material, including: large area uniformly non-magnetized plasma generating unit 1, radar cross section measuring mechanism 2, microwave anechoic chamber 3, support rail 4, support slider 5, and measured material plate 6. Absorbing material 8, large-area uniform non-magnetized plasma generating unit 1. Radar cross section measuring mechanism 2 is fixed in the microwave anechoic chamber 3, large-area uniform non-magnetized plasma generating unit 1 is surrounded by the absorbing material 8 in a space Inside, the absorbing material 8 has a window so that the measured material plate 6 of the large-area uniform non-magnetized plasma generating unit 1 faces the radar cross section measuring mechanism 2, and the measured material plate 6 is fixed on the support rail 4 and the support block 5. In the cavity of the large-area uniform non-magnetized plasma generation unit 1, the large-area unif...

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Abstract

The invention discloses a device and a method for measuring the radar reflection characteristic of a plasma coating material. The device comprises a large-area uniform unmagnetized plasma generation unit, a radar cross section measurement mechanism, a microwave unreflected chamber, a supporting guide rail, a supporting sliding block, a measured material plate and a wave-absorbing material, wherein the large-area uniform unmagnetized plasma generation unit and the radar cross section measurement mechanism are fixed in the microwave unreflected chamber; the large-area uniform unmagnetized plasma generation unit is surrounded in a space by the wave-absorbing material; and the wave-absorbing material is provided with a window, so that the measured material plate of the large-area uniform unmagnetized plasma generation unit directly faces the radar cross section measurement mechanism. By the device and the method, plasma can be coated on the surface of a measured material, and the adjustment of the thickness of the plasma and the weakening of the radar echo reflection of a body are further realized, so that the development of the experimental measurement of the radar reflection characteristic of the plasma coating material is met.

Description

Technical field [0001] The invention belongs to the technical field of microwave / radar detection, and relates to a device and method for measuring radar reflection characteristics of a plasma coating material, which can be used to uniformly coat the measured material with plasma and measure its radar reflection characteristics. Background technique [0002] As a special dispersive medium, plasma has unique absorption, reflection, and scattering characteristics for electromagnetic waves, which is very different from various conventional materials. Generally, the process of high-speed re-entry of various types of spacecraft, warheads and other targets will generate plasma to coat themselves due to friction and high temperature. The surface is equivalent to a composite material covering plasma, thereby changing the radar reflection characteristics of the target itself ( Usually attenuate radar echo). Therefore, the research of materials and target characteristics under plasma coati...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/20G01N22/00G01N21/00G01N1/28
Inventor 谢楷赵良秦永强李小平刘彦明刘东林
Owner XIDIAN UNIV