High-low-temperature normal-pressure heat cycle test device

Abstract

The invention discloses a high-low-temperature normal-pressure heat cycle test device which can operate by adopting a high-low-temperature environment simulating device combining a gas-liquid heat exchanger and a pipeline electric heater. The device can realize a heat cycle test environment in a temperature range from -100 DEG C to +100 DEG C under normal pressure. The high-low-temperature normal-pressure heat cycle test device comprises an environment simulating cabin body, a high-low-temperature gas generating system, a gas displacing system and a cold source system, and can finish a plurality of types of test processes needed by carrying out a heat cycle test. The environment simulating cabin body is used for placing a tested piece to be subjected to the heat cycle test; the high-low-temperature gas generating system is used for conveying gas and adjusting parameters including the speed, the temperature and the like for conveying air; the gas displacing system is used for discharging water steam and impurities in a system through a gas displacing effect in a displacing process so as to prevent the tested piece from being damaged; and the cold source system is used for providing a cold source in a temperature reducing process and providing nitrogen gas in the displacing process. The device has a simple structure and a reasonable design, and can effectively meet the requirements of the high-low-temperature heat cycle test.

Description

technical field [0001] The invention relates to a high-low temperature and normal-pressure thermal cycle test device, in particular to a thermal cycle test system capable of realizing an environment of -100°C to +100°C under normal pressure. Background technique [0002] In the development process of some electronic components, aerospace equipment, precision instruments and important mechanical parts, it is necessary to implement thermal cycle tests to test the performance and function of the products. quality defects. Compared with the vacuum thermal cycle test, the atmospheric pressure thermal cycle test has advantages in cost and test period, and the test is carried out in a high and low temperature test chamber. Through the search of the prior art, it is found that most of the existing high and low temperature test equipment adopts the method of mechanical refrigeration to realize the low temperature environment. This method makes the system more complicated and the ran...

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Problems solved by technology

Through the search of the prior art, it is found that most of the existing high and low temperature test equipment adopts the method of mechanical refrigeration to realize the low temperature environment. This method makes the system more complicated and the range of temperature reduction is limited. It is disclosed in the Chinese patent applications of 200410078807.3 and 200910201130.0 A high and low temperature test device that uses liquid nitrogen gasification to cool down, but in the specific implementation, liquid nitrogen spray or injection is used. If it is necessary to achieve a high temperature field uniformity, it is more difficult for the spray device or injection device. High design and control requirements

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