Photovoltaic assembly quality automatic detection method

A photovoltaic module, automatic detection technology, applied in the direction of optical testing flaws/defects, semiconductor/solid-state device testing/measurement, electrical components, etc., can solve the problems of poor quantification, single/polycrystalline cell lattice differences, and uncertain results and other issues, to achieve the effect of reducing logistics costs, fast detection speed, and improving production capacity

Inactive Publication Date: 2013-04-03
SUZHOU SUOLIWANG NEW ENERGY TECH CO LTD
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Problems solved by technology

However, because the cells come from different silicon wafer suppliers and different quality levels, the pictures are very different. At the same time, due to the difference in the crystal lattice of single-crystalline cells and poly-crystalline cells, it is difficult for the inspectors to quantify the quality of the final components, and the results are uncertain. Phenomenon

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  • Photovoltaic assembly quality automatic detection method

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Embodiment Construction

[0026] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0027] Such as figure 1 A photovoltaic module quality automatic detection method shown, the method steps are:

[0028] A) Component connection and energization: the automatic assembly line transports the components to be tested to the EL testing equipment, and connects and energizes with the EL testing equipment;

[0029] B) The equipment takes pictures: during the power-on process, the infrared camera works and shoots, and captures the pictures when the components are powered on;

[0030] C) Image analysis and comparison, the specified software in the EL testing equipment utilizes image recognition and analysis theory to pre-build a photovoltai...

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Abstract

The invention provides a photovoltaic assembly quality automatic detection method. The method comprises the following steps of: (A) carrying out assembly connection and electromotion; (B) filming picture through equipment; (C) carrying out picture analysis and comparison; (D) offering a judgment result through software; (E) preserving data and bar codes; and (F) finishing and entering the next circulation. The photovoltaic assembly quality automatic detection method provided by the invention effectively solves the problem of supposed judgment diversity due to standard diversification, and the detection method is safe, rapid and high efficient, the automaticity is high, and the economic benefit is improved and the like.

Description

technical field [0001] The invention relates to the automatic detection and determination of cell cracks in the production and manufacturing process of solar crystalline silicon photovoltaic modules, and especially designs an automatic detection method for the quality of photovoltaic modules. Background technique [0002] With the rapid development of the global new energy industry, the manufacture and use of solar crystalline silicon photovoltaic modules has attracted much attention. Its 25-year or 30-year quality commitment and product quality reliability have become the focus of industry and market attention. The unification of standards and the science of detection methods are a common problem faced by the industry. [0003] At present, in the quality inspection of photovoltaic modules, EL (electroluminescence) detection is an effective means to monitor the hidden cracks of the cells. From the appearance picture, you can clearly see the internal micro-crack texture and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L31/18H01L21/66G01N21/88
CPCY02P70/50
Inventor 袁永健
Owner SUZHOU SUOLIWANG NEW ENERGY TECH CO LTD
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