CMOS chip automatic short circuit test system and test method

An open-short-circuit test and chip technology, which is applied to the CMOS chip automatic open-circuit test system and the field of testing, can solve problems such as the inability to meet the MIPI interface CMOS chip open-circuit test and other problems, and achieve the effect of optimizing test efficiency and improving test accuracy.

Active Publication Date: 2016-12-28
KUNSHAN Q TECH CO LTD
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  • Claims
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Problems solved by technology

[0002] Open-short test (also known as OPEN / SHORT test, O / S test) is mainly used to test the connection of electronic devices. As the name implies, open-short test is to test open-circuit and short-circuit. Open-short test is widely used. PCB boards, test IC bonding wires, test IC packaging, test wires, test FPC, test membrane switches, test connectors, etc. Different applications have special requirements. At present, the open and short circuit tester for CMOS chips only Can be tested for parallel port products, but cannot meet the open and short circuit tests of more and more MIPI interface CMOS chips on the market

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Embodiment Construction

[0017] Such as figure 1 and figure 2 Shown, a kind of CMOS chip automatic open-short circuit test system, comprises main control chip, multiplexing module, liquid crystal display module and storage module, and described main control chip is connected with described multiplexing module, described liquid crystal display module respectively The module is connected with the storage module, the multiplexing module is connected with the CMOS chip to be tested, and the main control chip can collect signals through the pins of the CMOS chip to be tested through the multiplexing module and pass The software performs signal processing, can store the signal processing result through the storage module, and can also display the signal processing result through the liquid crystal display module.

[0018] Preferably, a dialing device is additionally provided, and the dialing device is connected to the multiplexing module, and the multiplexing module can select an interface matching the CM...

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Abstract

The invention discloses an automatic open short circuit test system for a CMOS (Complementary Metal-Oxide-Semiconductor Transistor) chip and a test method. The test system comprises a main control chip, a multiplexing module, a liquid crystal display module and a memory module, wherein the main control chip is respectively connected with the multiplexing module, the liquid crystal display module and the memory module, and the multiplexing module is connected with a CMOS chip to be tested; and the main control chip can collect signals from a pin of the CMOS chip to be tested through the multiplexing module and process the signals through software, and the signal processing results can be stored through the memory module and can be displayed through the liquid crystal display module. The test system can meet the automatic open short circuit test of various CMOS chips on the market, the test precision is increased while the test efficiency is optimized, and test standards can be set according to different CMOS chips.

Description

technical field [0001] The invention relates to an open-short circuit tester and a test method, in particular to a CMOS chip automatic open-short test system and a test method, suitable for DVP interface, MIPI single-channel interface, MIPI dual-channel interface, MIPI four-channel interface and automatic Open and short circuit tests of various types of CMOS chips such as interfaces are defined. Background technique [0002] Open-short test (also known as OPEN / SHORT test, O / S test) is mainly used to test the connection of electronic devices. As the name implies, open-short test is to test open-circuit and short-circuit. Open-short test is widely used. PCB boards, test IC bonding wires, test IC packaging, test wires, test FPC, test membrane switches, test connectors, etc. Different applications have special requirements. At present, the open and short circuit tester for CMOS chips only It can be tested for parallel port products, but it cannot meet the open and short circuit...

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01R31/02
Inventor钟岳良
OwnerKUNSHAN Q TECH CO LTD