Measurement method of spectral response non-uniformity of imaging optoelectronic system

Abstract

The invention discloses an imaging optoelectronic system spectral response heterogeneity measuring method and belongs to the field of optics measurement test. The imaging optoelectronic system spectral response heterogeneity measuring method forms a stable and even laser beam by utilizing a tunable laser light source and a laser stable power controller and combining an integrating sphere. After the even laser beam is collimated through a collimating lens, a uniformity compensator conducts uniformity correction on the collimated laser beam, a pinhole similar radiometer with a two-dimension scanning mechanism conducts uniformity measurement on the corrected even laser beam, smoothing process is conducted on a uniformity array of the laser beam through an arithmetic according to pixel values of a measured imaging optoelectronic system, a correction factor which corresponds to each pixel of the measured imaging optoelectronic system is obtained, and spectral response heterogeneity measurement of positions of different wavelengths of the imaging optoelectronic system is achieved. The imaging optoelectronic system spectral response heterogeneity measuring method solves a measurement difficult problem of spectral response heterogeneity of the existing imaging optoelectronic system and has the advantages of being high in measurement accuracy and wide in application prospect.

Description

technical field [0001] The invention belongs to the field of optical metrology and testing, and relates to a method for measuring the non-uniformity of spectral response, in particular to a method for measuring the non-uniformity of spectral response of an imaging photoelectric system. Background technique [0002] Imaging optoelectronic systems include various imaging optoelectronic systems from ultraviolet, visible to infrared, such as CCD cameras, CCD stereo cameras, aerospace cameras, imaging spectrometers, etc. Imaging optoelectronic systems are used to detect, identify and distinguish targets and backgrounds, and are widely used in satellites Remote sensing, space detection, military reconnaissance, military perception, target recognition, target tracking, military image communication and other fields. [0003] With the wide application and development of imaging optoelectronic systems in the military and aerospace fields, more stringent requirements are put forward fo...

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide a high-accuracy measurement method for the non-uniformity of the spectral response of the imaging photoelectric system to overcome the problem of measuring the non-uniformity of the spectral response of the imaging photoelectric system by using the uniform light source method. Problems with Spectral Response Non-Uniformity

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