Chemical vapor deposition reactor or epitaxial layer growth reactor and support device thereof

A chemical vapor deposition and supporting device technology, which is applied in directions from chemically reactive gases, chemical instruments and methods, crystal growth, etc., can solve the problem of cracking of the substrate carrier 300, inability to accurately measure the substrate temperature, and inability to accurately measure the reaction In-device substrate, etc.

Active Publication Date: 2013-06-05
ADVANCED MICRO FAB EQUIP INC CHINA
View PDF2 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, in the actual process, it is difficult for the aforementioned reactor to keep the substrate carrier 300 on the high-speed rotating main shaft 400 and make the two rotate together only by friction (for example: slipping due to insufficient friction). Solving this deficiency by an additional holding device will increase the complexity of the system; in addition, due to the limitation of the diameter of the main shaft 400, it is difficult to ensure that the substrate carrier 300 is always balanced during the deposition process. During the process, the center of gravity loses balance and swings, so that the epitaxial layer of the obtained substrate grows unevenly; moreover, due to the close fit between the main shaft wall 482 and the wall of the recessed part 390, in the substrate processing process, usually a high temperature environment , the main shaft 400 will generate thermal expansion, and the thermal expansion coefficient of the main shaft 400 is higher than that of the substrate carrier 300, the recessed part 390 will be broken due to the thermal expansion of the main shaft 400, and eventually the entire substrate carrier 300 will be cracked ; Finally, during the deposition process, the rotational speed of the spindle 400 is usually inconsistent with the rotational speed of the substrate carrier 300, and the two have a certain deviation, which makes it impossible to accurately measure the position of the substrate in the reactor, and then cannot accurately measure the substrate temperature and further control the temperature of the substrate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Chemical vapor deposition reactor or epitaxial layer growth reactor and support device thereof
  • Chemical vapor deposition reactor or epitaxial layer growth reactor and support device thereof
  • Chemical vapor deposition reactor or epitaxial layer growth reactor and support device thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0042] like Figure 2A as shown, Figure 2A A front view cross-sectional schematic view of a reactor provided according to an embodiment of the present invention is shown. The reactor may be used for chemical vapor deposition or epitaxial layer growth, but it should be understood that it is not limited to such applications. The reactor includes a reaction chamber 1, and at least one substrate carrier 3 and a supporting device 2 for supporting the substrate carrier 3 are arranged in the reaction chamber 1. The side wall of the reaction chamber 1 is provided with a transport port P for transporting the substrate carrier 3 in and out. The substrate carrier 3 includes a first surface 3a and a second surface 3b, wherein the first surface 3a is used to place a number of processed substrates, preferably, the first surface 3a is provided with some 20 substrates for placing Grooves or dimples (not shown) of the processed substrate (not shown). The second surface 3b of the substrate...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A chemical vapor deposition reactor or an epitaxial layer growth reactor comprises a reaction chamber; at least one substrate bearing rack and a support device for supporting the substrate bearing rack are disposed in the reaction chamber; the substrate bearing rack comprises a first surface and a second surface; the second surface of the substrate bearing rack is provided with at least one recessed part recessing inwards; the support device comprises a main shaft part, a supporting part which is connected with one end of the main shaft part, extends out along the periphery of the main shaft part, and comprises a supporting surface, and a plugging part which is connected with the main shaft part, and extends to a height along a direction towards the first surface of the substrate bearing rack; the plugging part of the support device can be separatedly plugged into the recessed part, so as to allow the substrate bearing rack to be placed on the support device and to be supported by the support device. The substrate bearing rack of the invention can realize balanced and reliable rotation during substrate processing process.

Description

technical field [0001] The present invention relates to the manufacture of semiconductor devices, in particular to a device for growing epitaxial layers or performing chemical vapor deposition on substrates such as substrates. Background technique [0002] During the production process of growing epitaxial layers or performing chemical vapor deposition on substrates such as substrates, the design of the reactor is critical. Reactors in the prior art come in a variety of designs, including: horizontal reactors, in which the substrates are mounted at an angle to the incoming reactant gases; planetary rotating horizontal reactors, In this reactor, the reaction gas is passed through the substrate horizontally; and in the vertical reactor, when the reaction gas is injected downward on the substrate, the substrate is placed on the substrate carrier in the reaction chamber and Relatively high speed rotation. This high-speed rotating vertical reactor is one of the most commerciall...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/44C23C16/458
CPCC23C16/458C23C16/4584C30B25/12
Inventor 尹志尧姜勇
Owner ADVANCED MICRO FAB EQUIP INC CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products