Solar cell multifunctional contact resistance automatic measuring instrument and measuring system thereof
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 广东顺德宙思信息科技有限公司
- Publication Date
- 2013-07-10
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Abstract
Description
technical field
[0001] The present invention relates to the testing field of crystalline silicon solar cells, in particular to a solar cell multifunctional automatic contact resistance measuring instrument, and also relates to a measuring system composed of the measuring instrument, which can automatically measure solar cell surface grid wire contact resistance, square resistance and surface resistance. Scan and measure the sheet resistance and resistivity of the silicon wafer surface. Background technique
[0002] The quality of the metal ohmic contact on the surface of crystalline silicon solar cells is reflected by the contact resistance. Contact resistance is an important aspect to consider in solar cell electrode optimization. The size of the contact resistance is not only related to the contact pattern, but also related to the diffusion process and contact formation process. The ohmic contact quality of different grid line patterns can be reflected by the size of the...