Measuring device for straightness and surface response uniformity of photodetector

Abstract

A measuring device for straightness and surface response uniformity of a photodetector comprises a light source part, a component part and an instrument, wherein the light source part comprises a pigtailed laser with the torque of 1053 Newton meters, an optical fiber attenuator and a fiber collimator; the component part comprises a diaphragm, one fourth of a wave plate, a wedge mirror, a mirror, a power attenuator, a polarization splitting prism, an optical switch and a BNC (bayonet nut connector) T-connector; and the instrument comprises a chopper, a lock-in amplifier, an incubator, a standard detector, a to-be-tested detector, a data acquisition card and a computer. The measuring device uses the principle of a dual light path superposition method and makes use of the advantages of a laser light source of narrow linewidth and the like advantages so that the accurate measurement of the straightness and surface response uniformity of various photodetectors under a specific wavelength can be realized. Furthermore, the measuring device has the advantages of stable operation, strong anti-interference, wide dynamic range, convenient and efficient measurement and the like, and repeated measurement precision is 0.08 percent better.

Description

technical field [0001] The invention belongs to a detector characteristic parameter measuring device, in particular to a measuring device for the straightness and surface response uniformity of a photodetector. Background technique [0002] Linear measurement has always been an extremely important part of photoradiometric research and performance evaluation of photoelectric sensors, and straightness is one of the most basic characteristic parameters of detectors. However, in general, almost all detectors have linearity problems. Moreover, the calibration of these detectors or the measurement system composed of these detectors can only be carried out within a very limited range, and most of the areas outside the calibration point can only be estimated by the linearity of the system. The accuracy is very poor; at the same time, general detector manufacturers do not give the surface response uniformity of large-area detectors, which is very bad for users who need this indicator...

AI Technical Summary

Problems solved by technology

[0002] Linear measurement has always been an extremely important part of photoradiometric research and performance evaluation of photoelectric sensors, and straightness is one of the most basic characteristic parameters of detectors. However, in general, almost all detectors have linearity problems. Moreover, the calibration of these detectors or the measurement system composed of these detectors can only be carried out within a very limited range, and most of the areas outside the calibration point can only be estimated by the linearity of the system. The accuracy is very poor; at the same time, general detector manufacturers do not give the surface response uniformity of large-area detectors, which is very bad for users who need this indicator

At present, there is no mature instrument for measuring the straightness of photodetectors on the market. The straightness of detectors is generally measured by building a detection platform in a laboratory where necessary. The measurement results of these measuring devices are often affected by the stability of the light source, Limitation of factors such as temperature and external environmental noise, especially when the optical power is below 0.01 microwatts, the influence of noise is very large, which seriously affects the measurement results

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