Synchronous monitoring device for femtosecond laser micromachining

A femtosecond laser and monitoring device technology, applied in the field of femtosecond laser optical path, can solve the problems of indetermination, cumbersome experiments, increased errors and complexity, etc., to improve processing accuracy and repeatability, uniform laser energy distribution, The effect of simplifying the processing steps

Inactive Publication Date: 2016-02-24
BEIJING UNIV OF TECH
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] At present, in femtosecond laser micromachining technology, the periodic structure induced during the interaction between laser and matter requires a small range of laser energy parameters to be able to form, and most of the micromachining is performed vertically. For microstructures induced under different angles and processing methods are immature
In this process, if we use the traditional method to conduct experiments, we will find that every time the laser interacts with the surface of the material, we cannot directly observe the changes on the surface of the material, so we cannot judge the impact of the experimental data on the material. Therefore, it is necessary to observe the material through other observation devices, so that the laser dot experiment requires a large number of repeated experiments, and repeated repeated observations will make the experiment very cumbersome.
At the same time, the position of each sample placement cannot be guaranteed to be at the same position, which will make the focus unable to accurately act on the surface of the processed object, which will further cause greater errors or even errors in the experimental results.
In addition, the traditional processing device cannot guarantee the consistency and repeatability of processing under different incident angles, which greatly increases the error and complexity of processing
Therefore, with the improvement of device precision and repeatability requirements, the existing technology can no longer meet the new requirements

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Synchronous monitoring device for femtosecond laser micromachining
  • Synchronous monitoring device for femtosecond laser micromachining
  • Synchronous monitoring device for femtosecond laser micromachining

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020] see figure 1 The synchronous monitoring device for femtosecond laser micromachining of the present invention includes: a femtosecond laser 1, and the device composition also includes: along the femtosecond laser optical path output by the femtosecond laser 1, two parallel total reflection mirrors 2, 2 are sequentially arranged ', attenuation film 3, polarizer 4, beam splitting prism 5, two diaphragms 6, 6', shutter 7, focusing lens 8 and processing object 16. The beam splitting prism 5 divides the femtosecond laser into two beams of identical energy, one beam is output along the femtosecond laser optical path of the femtosecond laser 1 for processing, while the other beam enters the power meter 17 along another optical path, As the energy specimen, the energy of the femtosecond laser is measured, which simplifies the processing steps and reduces the error caused by the energy measurement due to multiple interruptions of processing. In the present invention, the two ape...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A simultaneous monitoring device for femtosecond laser micromachining comprises a femtosecond laser, wherein two parallel holophotes, an attenuation piece, a polarizing film, a beam splitter prism, two diaphragms, a shutter, a focusing lens and a machining object are sequentially arranged along a femtosecond laser light path outputted by the femtosecond laser. The machining object is fixed on a rotating translation device, and the centers of the diaphragms and the vertical central line of the machining object are on the same plane. An L-type support is further fixed on the rotating translation device, and the L-type support is provided with a CCD for monitoring. The rotating translation device, the CCD and the L-type support are all connected with a computer through signal lines. The beam splitter prism divides femtosecond laser into two light beams having completely same energy, one light beam is used for machining along the femtosecond laser light path, and the other light beam enters a power meter along the other light path to measure the energy of the femtosecond laser. Real-time simultaneous monitoring for changes generated on the surface of the machining object is achieved, and errors caused by multimetering are reduced. The two diaphragms are the same in height and collinear, and the light beams are kept fixed.

Description

technical field [0001] The invention relates to femtosecond laser micromachining technology, more specifically, to a femtosecond laser micromachining synchronous monitoring device and a femtosecond laser light path. Background technique [0002] Femtosecond laser processing technology can break through the limitation of processing accuracy due to the diffraction limit in optical micromachining methods, and has the ability to directly process real three-dimensional microstructures inside transparent materials. It is a precision technology that can achieve no heat affected zone. laser processing technology. Femtosecond laser processing has the following advantages: (1) The heat effect on the surrounding processing area is small; (2) It can process other materials that are difficult to process with lasers, such as transparent materials, high melting point materials, thermal decomposers and thermally deformable materials, etc.; ( 3) Femtosecond laser micromachining technology h...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): B23K26/03B23K26/067B23K26/073
Inventor 刘世炳董祥明宋海英刘嵩
Owner BEIJING UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products