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Method and system for monitoring aging test on wireless distributed power source

A technology of distributed power supply and aging test, applied in electrical testing/monitoring and other directions, can solve the problems of high cost, low degree of automation, complex system price, etc., and achieve the effect of saving system cost, improving use efficiency, and good design scalability

Active Publication Date: 2013-10-23
LILING FULLRIVER ELECTRONICS & TECH LTD
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AI Technical Summary

Problems solved by technology

At present, the automation level of many aging vehicles is not high, requiring manual inspection of test status, manual power-off, etc., or the system is too complicated and the price is too expensive

Method used

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  • Method and system for monitoring aging test on wireless distributed power source
  • Method and system for monitoring aging test on wireless distributed power source
  • Method and system for monitoring aging test on wireless distributed power source

Examples

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Embodiment 1

[0049] like figure 1, the system mainly includes the detection sub-board, the main board and the upper computer. Each detection sub-board is responsible for the monitoring of an aging car. When the power state changes or the timing is up, the sub-board can upload the corresponding information to the main board and perform Relay off control. The main board is mainly responsible for the communication with the upper computer, the management of the sub-board, and the alarm. The management of the sub-board is mainly the setting of voltage, temperature, and time thresholds. The communication between the main board and the sub-board uses ZigBee wireless communication, which can greatly reduce system wiring. Improve the scalability of the system. On the host computer, you can set the test voltage and temperature thresholds, test time, and check the status of the test power supply. At the same time, the software can automatically control the shutdown of each test power supply and reco...

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Abstract

The invention discloses a method and system for monitoring an aging test on a wireless distributed power source. The system comprises a main board and at least one auxiliary board used for being connected with aging vehicles, and the main board is connected with the auxiliary board in a communication mode. The auxiliary board comprises a microprocessor, a voltage collecting circuit, a temperature collecting circuit and a turn-off control circuit, and the voltage collecting circuit, the temperature collecting circuit and the turn-off control circuit are all connected with and controlled by the microprocessor. In the voltage collecting circuit of the auxiliary board, a plurality of signal input ends of a first multiplexer are connected with output voltage of multiple ways of test power sources of the aging vehicles respectively, the output end of the first multiplexer sequentially passes through an amplifying circuit and a first A / D convertor and is connected with an input port of the microprocessor, and the chip selection end and the channel gating end of the first multiplexer are connected with an output port of the microprocessor. The method and system for monitoring the aging test on the wireless distributed power source can support multi-way voltage collecting and multi-way temperature collecting on the aging vehicles, and complete automated tests of a plurality of switching power sources.

Description

technical field [0001] The present invention relates to a wireless distributed power supply aging test monitoring method and system, in particular to a monitoring system and method for aging vehicles for switching power supply aging tests with a large amount of data collection and many test channels. Background technique [0002] Switching power supplies must undergo an aging test before leaving the factory. The aging test controls the temperature, humidity and other environments. The power supply operates in this environment for a specified time, and at the same time detects the voltage of each test power supply and the temperature of the load resistance. If the voltage or temperature data of the power supply is abnormal during the test, the test cannot pass, and the power circuit must be cut off immediately to ensure safety; if there is no abnormality within the test time, the test is passed, and the test power supply is cut off after the test. [0003] Usually, the aging ...

Claims

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Application Information

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IPC IPC(8): G05B23/02
Inventor 郭敏胡志坤廖北平刘斌张钰波郭海良
Owner LILING FULLRIVER ELECTRONICS & TECH LTD
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