Accelerated aging test device of nonlinear resistor disc and method for testing aging characteristics of nonlinear resistor disc

A technology of non-linear resistors and test devices, which is applied in the direction of measuring devices, parts of electrical measuring instruments, and measuring electricity, can solve the problems of inability to test and study DC aging characteristics, and cannot realize data comparison tests and comparisons, etc., to achieve improvement Operability, complete functions, and accurate results

Inactive Publication Date: 2013-11-13
XI AN JIAOTONG UNIV +1
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  • Abstract
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Problems solved by technology

However, the original test devices and methods cannot be used for the test and research of DC aging characteristics, and at the same time, it is impossible to achieve complete data comparison and test and comparison under different types of voltages of the same device

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  • Accelerated aging test device of nonlinear resistor disc and method for testing aging characteristics of nonlinear resistor disc
  • Accelerated aging test device of nonlinear resistor disc and method for testing aging characteristics of nonlinear resistor disc
  • Accelerated aging test device of nonlinear resistor disc and method for testing aging characteristics of nonlinear resistor disc

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Embodiment Construction

[0040] The structural working principle and test method of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0041] see figure 1 with figure 2 , the accelerated aging test device of the non-linear resistor sheet of the present invention comprises a stabilized voltage power supply 1, a high voltage test power supply 2, a waveform switching mechanism 3, a temperature test chamber 4, a control unit 5, a measurement unit 6 and a computer data analysis management unit 7; The test power supply 2 includes a voltage regulator, a transformer and a rectifier. The voltage regulator is set at the input end of the transformer, and the rectifier is set at the output end of the transformer; the output end of the regulated power supply 1 is connected to the input end of the high-voltage test power supply 2; the high-voltage test The output end of the power supply 2 is correspondingly connected to the input end of...

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Abstract

The invention discloses an accelerated aging test device of a nonlinear resistor disc and a method for testing aging characteristics of the nonlinear resistor disc. The accelerated aging test device of the nonlinear resistor disc comprises a voltage-stabilized source, a high-voltage test power source, a waveform switch mechanism, a temperature test box, a control unit, a measurement unit and a computer data analysis and processing unit. The high-voltage test power source and the waveform switch mechanism are matched and arranged, so that supply, selection and switch of a direct current high-voltage power supply and an alternating current high-voltage power supply are achieved, the blank is filled, and the application range is wide; data is acquired by the measurement unit and output to the computer data analysis and processing unit for storing statistic and graphic plotting of the data , further, the data can be displayed, inquired and output, functions are complete, and statistics are comprehensive; and the high-voltage power supplies can be automatically switched by virtue of cooperative control of the control unit and the computer data analysis and processing unit, and the operation is simple, safe and efficient. The invention further provides the method for testing the aging characteristics, and according to the method, the test device is utilized, relative data is analyzed and processed, and an aging curve and data parameters can be obtained.

Description

technical field [0001] The invention relates to an aging test and testing of an overvoltage protector in the field of electric power system or electronic communication, in particular to an accelerated aging test device for a non-linear resistor and a testing method for its aging characteristics. Background technique [0002] With the development of power transmission and distribution in the direction of ultra-high voltage, and the development of electronic information in the direction of high integration and high digitization, the damage caused by lightning overvoltage and operating overvoltage is increasing day by day, so overvoltage protection has caused more and more problems. attention and attention. Nonlinear resistors are widely used in overvoltage protection in the fields of power systems, electronics and communications because of their excellent nonlinear characteristics and surge absorption capabilities, especially zinc oxide nonlinear resistors. [0003] Accelerat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/28
Inventor 姚学玲陈景亮廖永力胡上茂李锐海
Owner XI AN JIAOTONG UNIV
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