A double-mirror detection and analysis method for an X-ray detection and imaging system

Abstract

The invention relates to a double-lens detection and analysis method of X-ray detecting and imaging system, which comprises the following steps: (1) regulating a double-lens cylinder to transfer a first X-ray combination refraction lens into the light path, so that an X-ray beam emitted by an X-ray light tube is irradiated to an incidence caliber of the first X-ray combination refraction lens; transmitting the X-ray beam emitted by the first X-ray combination refraction lens into an X-ray detector of the X-ray detecting and imaging system to carry out detection and analysis, thereby obtaining a primary detection and analysis result; (2) obtaining the primary detection and analysis result by the step (1); and (3) regulating the double-lens cylinder to transfer the first X-ray combination refraction lens out of the light path, and transferring an X-ray bridge-type combination refraction lens into the light path, and repeating the operation for the first X-ray combination refraction lens in the step (1) to obtain a secondary detection result. The method can obtain a high microzone resolution and regulate the resolution on line.

Description

technical field [0001] The invention relates to the field of X-ray detection and imaging, in particular to a detection and analysis method for an X-ray detection and imaging system. Background technique [0002] Since Roentgen discovered X-rays in 1895, the unique characteristics of X-rays have made it play a huge role in the fields of medicine and industrial flaw detection. The unique characteristics of X-rays refer to: the higher the photon energy of X-ray radiation, the shorter the wavelength, and the higher the resolution of the corresponding X-ray diagnostic system; at the same time, the large penetration depth of X-rays, The opaque internal structures of various samples can be observed non-destructively. In recent years, with the development of X-ray radiation sources and X-ray optical components, X-ray detection and imaging technology has developed towards higher resolution and better non-destructiveness, for example, for the measurement of element distribution in sa...

AI Technical Summary

Problems solved by technology

[0003] In order to overcome the deficiencies of the existing detection and analysis technology of X-ray detection and imaging systems, such as the low resolution of the micro-area, the resolution cannot be adjusted online, and the inability to realize hierarchical detection, the present invention provides a method for obtaining high micro-area resolution while resolving Double-mirror detection and analysis method for X-ray detection and imaging system with online rate adjustment

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