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Method for improving quality of energy spectrum face distribution image of inorganic non-metal material sample

An inorganic non-metal, image quality technology, applied in the field of material analysis, can solve the problems of time-consuming, expensive testing, and difficult, and achieve the effects of avoiding image drift, convenient sample disassembly, and firm sample installation.

Inactive Publication Date: 2013-12-18
TONGJI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, it is time-consuming, difficult and expensive to improve the quality of energy spectrum images by optimizing the working conditions of the electron microscope.

Method used

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  • Method for improving quality of energy spectrum face distribution image of inorganic non-metal material sample
  • Method for improving quality of energy spectrum face distribution image of inorganic non-metal material sample
  • Method for improving quality of energy spectrum face distribution image of inorganic non-metal material sample

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] Embodiment 1, observe the phase composition and the distribution of a kind of cement clinker-gypsum mixture with energy spectrum surface distribution map, carry out image collection according to the following steps:

[0030] (1) Sample installation: put the cement clinker-gypsum-epoxy resin sample that has been ground, polished, and evaporated carbon conductive layer into a non-magnetic stainless steel bracket, with the observation surface facing up, and the installation is firm, and then, through the bracket Bolts at the bottom fix the sample and the bracket as a whole on the observation platform of the scanning electron microscope;

[0031] (2) Paste conductive glue: use 3 conductive glue to connect the observation surface of the sample and the side wall of the bracket;

[0032] (3) Acquisition of energy spectrum surface distribution image: the energy spectrum surface distribution image of Ca element is collected by silicon drift electric cooling X-ray energy spectrum...

Embodiment 2

[0033] Example 2, observe the phase composition and distribution of a type I Portland cement with an energy spectrum distribution map, and perform image acquisition according to the following steps:

[0034] (1) Sample installation: Put the Portland cement-epoxy resin sample that has been ground, polished, and evaporated carbon conductive layer into a non-magnetic stainless steel bracket, with the observation side facing up, and the installation is firm, and then, through the bottom of the bracket The bolts fix the sample and the bracket as a whole on the observation platform of the scanning electron microscope;

[0035] (2) Paste conductive glue: use 3 conductive glue to connect the observation surface of the sample and the side wall of the bracket;

[0036] (3) Acquisition of energy spectrum surface distribution image: use silicon drift electric cooling X-ray energy spectrum detector to simultaneously collect energy spectrum surface distribution images of Ca and Si elements....

Embodiment 3

[0037] Embodiment 3, observe the phase composition and the distribution of a kind of fly ash with energy spectrum surface distribution map, carry out image acquisition according to the following steps:

[0038] (1) Sample installation: put the fly ash-epoxy resin sample that has been ground, polished, and evaporated a carbon conductive layer into a non-magnetic stainless steel bracket, with the observation side facing up, and the installation is firm, and then, through the bottom of the bracket The bolts fix the sample and the bracket as a whole on the observation platform of the scanning electron microscope;

[0039] (2) Paste conductive glue: use 4 conductive glue to connect the observation surface of the sample and the side wall of the bracket;

[0040] (3) Acquisition of energy spectrum surface distribution image: use silicon drift electric cooling X-ray energy spectrum detector to simultaneously collect energy spectrum surface distribution images of Al and Si elements. T...

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Abstract

The invention relates to a method for improving the quality of an energy spectrum face distribution image of an inorganic non-metal material sample. The method comprises the following steps: (1) mounting a sample; (2) sticking a conductive adhesive; (3) electrically freezing the energy spectrum face distribution image of a collection element of an X-ray energy spectrum detector by using silicon drifting. According to an image acquisition method, the gray difference of a chemical constitution close phase in an element energy spectrum image can be increased, phenomena such as grain inner pixel lacking, grain edge blurring and image whole drifting are remitted, and the image acquisition time is shortened. The method is good for reducing the sample preparing difficulty and shortening time needed by an electric mirror observation condition optimizing test; during a shooting process, liquid nitrogen is not needed for cooling.

Description

technical field [0001] The invention relates to the field of material analysis, in particular to a method for improving the image quality of energy spectrum surface distribution of inorganic non-metallic material samples. Background technique [0002] In the study of the phase composition and distribution of inorganic non-metallic materials, the combination of backscattered electron images and element energy spectrum surface distribution images is a very effective microscopic testing method. If supplemented with digital image processing, the area fraction, perimeter fraction and correlation functions of various phases can also be obtained. Especially for cement and other materials with complex phase composition and uneven distribution, it is very important to accurately grasp the above information to understand the reaction process of materials. If this method is adopted, the key factor determining the analysis results is the quality of the spectral image. [0003] Since m...

Claims

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Application Information

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IPC IPC(8): G01N23/22G01N1/36
Inventor 吴丹琳王培铭刘贤萍
Owner TONGJI UNIV
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