Device and method for measuring deep dielectric charging characteristic parameter of spacecraft dielectric material

Abstract

The invention provides a device and a method for measuring deep dielectric charging characteristic parameter of a spacecraft dielectric material. The device comprises a radiation source, a vacuum unit, a sample target table, a control unit, an electrostatic potentiometer, an electrometer, a total conductivity acquisition unit, a potential attenuation measurement unit, a first processing unit and a second processing unit, wherein the electrostatic potentiometer is used for measuring the surface potential of a sample medium under certain flux; the electrometer is used for measuring the leakage current of the sample under certain flux; the total conductivity acquisition unit is used for acquiring the total conductivity based on the measured surface potential and the leakage current; the first processing unit is used for obtaining dark conductivity values under all fluxes based on the obtained potential attenuation curve along with the passage of time and a charge storage attenuation method, and taking an average to obtain the dark conductivity Sigma O; the second processing unit is used for obtaining radiation induction conductivity corresponding to the dosage rate generated in material volume under two different kinds of beam intensity based on the obtained dark conductivity and the total conductivity, so as to obtain the related parameters Kp and the dimensionless exponent delta value of the sample material.

Description

technical field [0001] The invention relates to the content of measuring the electrical conductivity of a spacecraft dielectric material, in particular to a device and method for measuring the deep-layer charging characteristic parameters of a spacecraft dielectric material. Background technique [0002] During solar activity, the flux of high-energy electrons in the earth's middle and high orbits will be significantly enhanced. These high-energy electrons can penetrate the skin of the spacecraft, deposit and establish an electric field on the insulating medium or isolated conductor inside it, and if the charge causes the built-in electric field of the medium When the strength reaches the breakdown threshold, or a high potential difference appears between adjacent structures, electrostatic discharge will be generated, causing interference, false instructions, and even burning to the electronic system of the spacecraft. Statistics from the United States on the causes of 298 s...

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Problems solved by technology

[0013] (2) Charge storage decay method

When the irradiation stops, the radiation-induced conductivity decays quickly. Generally, after a few minutes of irradiation stop, the radiation-induced conductivity decreases by about 2 to 3 orders of magnitude. Therefore, it is difficult to measure the medium through the decay curve of the potential with time. The radiation-induced conductivity of materials can only measure the dark conductivity of dielectric materials, which cannot meet the needs of deep charging analysis

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