Manufacturing method for TSV and first layer re-wiring layer needless of using CMP
A technology of rewiring layer and manufacturing method, applied in semiconductor/solid-state device manufacturing, electrical components, electrical solid-state devices, etc., can solve the problems of high cost and many process steps, and achieves reduction of process cost, reduction of process steps, and elimination of CMP. The effect of the polishing step
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[0037] The present invention will be further described below in conjunction with drawings and embodiments.
[0038] The reason why the traditional method does not reuse the diffusion barrier layer and the seed layer is that the CMP process cannot control the thickness of the remaining metal layer, and cannot guarantee that after CMP treatment, a thin layer of metal remains on the surface evenly as the seed layer for RDL electroplating. To ensure performance, the surface metal and diffusion barrier layer are generally removed, and then re-deposited. The present invention designs a special processing flow, and provides a manufacturing method of TSV and the first layer of rewiring layer without using CMP. Figure 6 As shown, each process step is introduced below.
[0039] (1) S0: if Figure 7 As shown, the TSV electroplating filling and annealing operations have been completed on the substrate 1, the filling material is metal copper 4, and the filling method is electroplating. ...
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