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Double-ionization ion source

An ion source and ionization chamber technology, applied in the field of ion sources, can solve the problems of inapplicability of difficult-to-ion samples, low ionization energy, and difficulty in spectral analysis, and achieve the effect of improving quality selection and broadening applicability

Inactive Publication Date: 2014-02-19
DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] The sample to be tested can only be detected by mass spectrometry after being ionized by the ion source in the ionization chamber. The previous ionization method is usually a single hard ionization or soft ionization. Soft ionization can obtain the molecular ion peak of the sample, which can better analyze the spectrum. , but the ionization energy is low, which is not suitable for samples that are difficult to ionize; the ionization energy of hard ionization is relatively high, but it is easy to generate fragment ions, which brings certain difficulties to the analysis of spectra

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  • Double-ionization ion source

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[0011] Combine below figure 1 The present invention is further described.

[0012] Such as figure 1 As shown, a double ionization ion source of the present invention starts from a sample tube, followed by a repeller, an ionization chamber, a filament, an ultraviolet lamp, an extractor, a focus electrode, an emitter, a ground grid and a repeller. Wherein, the filament is located on one side of the ionization chamber, and the ultraviolet lamp is located above the ionization chamber.

[0013] The invention adopts electron bombardment ionization or ultraviolet photoionization, broadens the applicability of a single ion source for analyzing multi-form samples, improves the mass selection of fragment ions, and can effectively analyze ion composition and sample structure. The ions generated by ionization are repelled by the repelling pole to the analyzer, converge through the extraction pole and focusing pole during the repulsion process, and finally gather at the exit of the ion s...

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Abstract

The invention provides a double-ionization ion source which is composed of electron bombardment ionization (an EI source) and vacuum ultraviolet lamp ionization (a PI source). According to the structure, the double-ionization ion source comprises a sample feeding tube, a repelling electrode, an ionization chamber, a filament, an ultraviolet lamp, a lead-out electrode, a focusing electrode, an emitting electrode, a repelling board and a grounding grid board. According to the double-ionization ion source, the applicability is broadened when polymorphic samples are analyzed by a single ion source, quality selection of fragment ions is improved, and the ion composition and a sample structure can be effectively analyzed.

Description

technical field [0001] The invention belongs to the field of ion sources, and in particular relates to a double ionization ion source. Background technique [0002] Mass spectrometry is an analytical method for measuring the charge-to-mass ratio of ions. Its principle is to ionize the components in the sample in the ion source to generate positively charged ions with different charge-to-mass ratios. The ion beam, enters the mass analyzer. In the mass analyzer, the electric and magnetic fields are used to make the opposite velocity dispersion occur, and they are respectively focused to obtain a mass spectrum, thereby determining its mass. [0003] The sample to be tested can only be detected by mass spectrometry after being ionized by the ion source in the ionization chamber. The previous ionization method is usually a single hard ionization or soft ionization. Soft ionization can obtain the molecular ion peak of the sample, which can better analyze the spectrum. , but the ...

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Application Information

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IPC IPC(8): H01J49/10H01J49/14H01J49/16
Inventor 唐紫超史磊李刚王兴龙吴小虎张世宇
Owner DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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