High temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method

A technology of translucent material and apparent emissivity, which is used in measurement devices, analysis materials, material analysis by optical means, etc., can solve the problems of low temperature upper limit, low measurement accuracy, and measurement dead angle.
CN103674888AActive Publication Date: 2014-03-26HARBIN INST OF TECH
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
HARBIN INST OF TECH
Publication Date
2014-03-26

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Abstract

The invention relates to a high temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method, belongs to the technical field of high temperature physical function material hot measurement and aims to solve the problems of low accuracy, low temperature upper limit, narrow measuring waveband and existence of dead measuring angle in the conventional semitransparent material spectrum direction apparent emissivity measurement. According to the invention, a fourier infrared spectrometer is used for measuring the high temperature normal direction transmissivity and the high temperature normal direction emissivity of a semitransparent material respectively, further the spectral refractivity and the spectral absorption factor of the semitransparent material are computed according to a radiation transfer inverse problem solving method, and finally the high temperature spectrum direction apparent emissivity of the semitransparent material is computed through the spectral refractivity and the spectral absorption factor of the material. The invention provides a method capable of accurately measuring the spectrum direction apparent emissivity of the semitransparent material, and can be widely applied to various fields of aviation, military, energy sources, chemical engineering and atmospheric sciences and the like.
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Description

technical field

[0001] The invention relates to a device and method for inversely measuring apparent emissivity in the spectrum direction of a high-temperature translucent material, and belongs to the technical field of thermophysical property measurement of high-temperature materials. Background technique

[0002] Emissivity is defined as the ratio of the surface radiant energy of a material to the radiant energy of a black body at the same temperature. The emissivity of the surface of various materials is a physical quantity that characterizes the radiation ability of the surface of the material, and is an extremely important thermophysical parameter. According to the wavelength range, the emissivity can be divided into full-spectrum emissivity, spectral emissivity and band emissivity; according to the measurement direction, it can be divided into hemispherical emissivity and directional emissivity. The measurement of material emissivity involves many fields such as aeros...

Claims

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