High temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method

A technology of translucent material and apparent emissivity, which is used in measurement devices, analysis materials, material analysis by optical means, etc., can solve the problems of low temperature upper limit, low measurement accuracy, and measurement dead angle.

Active Publication Date: 2014-03-26
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to solve the problems of low measurement accuracy, low temperature upper limit, narrow measurement band and measurement dead angle of the apparent emissivity in the sp

Method used

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  • High temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method
  • High temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method
  • High temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method

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specific Embodiment approach 1

[0114] Specific implementation mode 1. Combination figure 1 Describe the specific implementation mode, a high-temperature translucent material spectral direction apparent emissivity inverse measurement device, which includes a data processing system 1, a Fourier transform infrared spectrometer 2, a vacuum tank 7, and a blackbody light source placed in the vacuum tank 7 A6, rotatable reflector 4, blackbody radiation heater 5 and blackbody light source B3; Blackbody radiation heater 5 and rotatable reflector 4 are positioned between blackbody light source A6 and blackbody light source B3, and blackbody radiation heater 5 is positioned at blackbody light source A6 and Between the rotatable reflectors 4; the blackbody radiation heater 5 is used for radiative heating of the translucent test piece 9 to be tested to keep both surfaces of the translucent test piece 9 being translucent boundary conditions, and to make the translucent test piece 9 The radiation energy projected onto the...

specific Embodiment approach 2

[0115] Specific embodiment two, combine figure 1 To illustrate the specific implementation, the outer wall of the vacuum tank 7 is provided with a circulating water thermostat sleeve (8). Other compositions and connections are the same as in the first embodiment.

[0116] Place the test piece 9 and its heating device in the vacuum tank 7 to avoid the influence of natural convection on the temperature field of the test piece; use radiation heating to keep both surfaces of the test piece are translucent boundary conditions, while the radiation heater 5 In order to approximate a black body, all the radiant energy projected on the heater through the translucent test piece can be absorbed; the outside of the vacuum tank 7 is cooled by circulating water to maintain a constant temperature in the tank, avoiding the influence of background stray radiation on the measurement.

specific Embodiment approach 3

[0117] Specific embodiment 3. Based on the specific embodiment 1, the method for inversely measuring the apparent emissivity of the spectral direction of the high-temperature translucent material is realized by the following steps:

[0118] Step 1. Turn on the incident blackbody light source (blackbody light source A6), and use the Fourier transform infrared spectrometer to collect the spectral radiation signal data of the blackbody light source and record it as S 1 ;

[0119] Step 2. Place the sample in the test piece rack, turn on the radiation heater, heat the sample to the predetermined test temperature, keep the temperature stable, use the Fourier transform infrared spectrometer to collect data and record it as S 2 , the obtained data S 2 Including: ①The remaining signal S after the spectral radiation signal of the black body light source passes through the translucent specimen 1 ′; ②The spectral radiation signal S of the translucent specimen itself s ; ③ The remaining...

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Abstract

The invention relates to a high temperature semitransparent material spectrum direction apparent emissivity inversion measuring device and method, belongs to the technical field of high temperature physical function material hot measurement and aims to solve the problems of low accuracy, low temperature upper limit, narrow measuring waveband and existence of dead measuring angle in the conventional semitransparent material spectrum direction apparent emissivity measurement. According to the invention, a fourier infrared spectrometer is used for measuring the high temperature normal direction transmissivity and the high temperature normal direction emissivity of a semitransparent material respectively, further the spectral refractivity and the spectral absorption factor of the semitransparent material are computed according to a radiation transfer inverse problem solving method, and finally the high temperature spectrum direction apparent emissivity of the semitransparent material is computed through the spectral refractivity and the spectral absorption factor of the material. The invention provides a method capable of accurately measuring the spectrum direction apparent emissivity of the semitransparent material, and can be widely applied to various fields of aviation, military, energy sources, chemical engineering and atmospheric sciences and the like.

Description

technical field [0001] The invention relates to a device and method for inversely measuring apparent emissivity in the spectrum direction of a high-temperature translucent material, and belongs to the technical field of thermophysical property measurement of high-temperature materials. Background technique [0002] Emissivity is defined as the ratio of the surface radiant energy of a material to the radiant energy of a black body at the same temperature. The emissivity of the surface of various materials is a physical quantity that characterizes the radiation ability of the surface of the material, and is an extremely important thermophysical parameter. According to the wavelength range, the emissivity can be divided into full-spectrum emissivity, spectral emissivity and band emissivity; according to the measurement direction, it can be divided into hemispherical emissivity and directional emissivity. The measurement of material emissivity involves many fields such as aeros...

Claims

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Application Information

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IPC IPC(8): G01N21/3563
Inventor 齐宏牛春洋孙双成郑献之阮立明姜宝成
Owner HARBIN INST OF TECH
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