Direct-current short-time supply interruption and supply voltage leap simulation test device

Abstract

The invention discloses a direct-current short-time supply interruption and supply voltage leap simulation test device, which comprises a manual switch connected with a system under test, wherein the manual switch is connected with a direct current supply voltage leap variable load in parallel, and is switched in a supply network through a first switching element; two ends of a second switching element are respectively switched in between the first switching element and the supply network as well as between the manual switch and the system under test in parallel; and the first switching element and the second switching device are respectively connected with a microprocessor. According to the test device, the microprocessor can control to ensure the switching elements to be switched off completely, and the accurate time for switching off and switching on the two switching elements can be accurately controlled, so that the time for direct-current short-time supply interruption is accurately controlled; when a supply voltage leap simulation test is carried out, resistance has no need to be switched in manually, so that the labor intensity is reduced, and the test safety is improved; and the prolonged time for voltage leap is shorter, so that a current situation can be better simulated.

Description

technical field [0001] The invention relates to a combined test device for traction electrical equipment, in particular to a simulation test device for DC short-time power supply interruption and power supply voltage mutation. Background technique [0002] During the actual operation of traction electrical equipment, there must be various complex situations such as voltage fluctuations and short-term interruptions of the actual power grid. In order to simulate its actual operating environment and test the reliability of the equipment under test, short-term DC power supply interruption tests and power supply voltage mutation tests must be carried out. Because the voltage fluctuation of the actual power grid is different, and the power supply interruption time is also different, so when conducting the DC short-term power supply interruption simulation test, the wiring efficiency is low, the test preparation workload is large, and the DC short-time power supply interruption can...

AI Technical Summary

Problems solved by technology

Because the voltage fluctuation of the actual power grid is different, and the power supply interruption time is also different, so when conducting the DC short-term power supply interruption simulation test, the wiring efficiency is low, the test preparation workload is large, and the DC short-time power supply interruption cannot be accurately controlled. Time; at present, when performing a power supply voltage mutation simulation test, it is necessary to manually insert a resistor in the system under test, and each test needs to be re-wired, the work intensity is high, the efficiency is low, and the delay time of the voltage mutation is long, which cannot be simulated well reality

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