Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for managing memory

A memory management and memory technology, applied in the computer field, can solve problems such as fewer models, faster capacitor power discharge, cumbersome peripheral control circuits, etc., and achieve the effects of avoiding reading errors, widening the operating temperature range, and reducing costs

Active Publication Date: 2014-03-26
广东省工业边缘智能创新中心有限公司
View PDF4 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] According to the reading method, the memory is divided into read-only memory (Read Only Memory, referred to as ROM) and random access memory (Random Access Memory, referred to as RAM). Memory is generally implemented with RAM, which relies on the principle of capacitor charging and discharging to store data, and realizes data reading through an n-channel MOS transistor (nMOS) that controls the switching of the capacitor. However, as the temperature decreases, the MOS leakage current increases. Larger, so that the electric capacity on the capacitor is discharged faster, so that when the data needs to be read, the electric capacity on the capacitor is lower than the effective voltage, which makes the data reading error
[0004] At present, in order to use memory in a low-temperature environment, there are mainly two methods. The first is to use memory chips suitable for a wide temperature range. There are few product models, the working frequency is lower than the usual frequency, and the price is expensive; the second method uses an external auxiliary heating device to heat the memory. When the environmental file is monitored to rise to the allowable working temperature, the power is turned on again. This method is additionally cumbersome The peripheral control circuit, and in order to effectively transfer the temperature to the memory, it is often necessary to change the structure of the memory, which increases the cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for managing memory
  • Method and system for managing memory
  • Method and system for managing memory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] The technical solution of the memory management method and system will be described in detail below in conjunction with specific embodiments and drawings, so as to make it more clear.

[0047] like figure 1 Shown, in one embodiment, a kind of memory management method comprises the following steps:

[0048] Step S110, monitoring the temperature value of the environment where the memory is located.

[0049] Specifically, the temperature value of the environment where the memory is located can be realized by a temperature monitoring module. For example, the temperature monitoring module can be a temperature sensor or a temperature monitoring chip integrated with a PN junction inside, and the temperature sensor can be a thermistor or a PN junction. The temperature analog signal is collected by the temperature sensor, and then converted into a temperature digital signal by the analog-to-digital converter, and then the temperature digital signal is transmitted to the compute...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a method and system for managing a memory. The method for managing the memory comprises the following steps that the temperature value of the environment where the memory is located is monitored; whether the temperature value is smaller than a preset lowest work temperature or larger than a preset highest work temperature or not is judged, and if yes, the refreshing frequency of the memory is adjusted to refreshing frequency corresponding to the temperature value. According to the method and system for managing the memory, when the monitored temperature value is smaller than the lowest work temperature, the refreshing frequency of the memory is adjusted to the refreshing frequency corresponding to the temperature value, the data of the memory can be read before the data in the memory decrease below a threshold voltage, reading errors are avoided, and when the environment temperature is lower than the lowest work temperature or higher than the highest work temperature, an additional heating circuit does not need to be designed to heat the memory at low temperature, or the memory does not need to be cooled at high temperature, an expensive memory does not need to be selected to adapt to the low temperature environment and the high temperature environment, cost is lowered, and the work temperature range of the memory is widened.

Description

technical field [0001] The invention relates to computer technology, in particular to a memory management method and system. Background technique [0002] Memory is an important part of the computer system architecture. It realizes the data storage function: storing original data, intermediate data and calculation results, etc., and is also a buffer unit for high-speed execution units and external low-speed storage devices. [0003] According to the reading method, the memory is divided into read-only memory (Read Only Memory, referred to as ROM) and random access memory (Random Access Memory, referred to as RAM). Memory is generally implemented with RAM, which relies on the principle of capacitor charging and discharging to store data, and realizes data reading through an n-channel MOS transistor (nMOS) that controls the switching of the capacitor. However, as the temperature decreases, the MOS leakage current increases. Larger, so that the electric capacity on the capacit...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F9/46
Inventor 陈志列廖宇晖
Owner 广东省工业边缘智能创新中心有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products