A kind of LED standard square piece and manufacturing method thereof

Abstract

The invention provides an LED standard square sheet and a manufacturing method thereof. The standard square sheet comprises a glue film. A plurality of crystal particles are arranged on the glue film. The crystal particles are selected from LED wafers which have the same substrates, are of an extension structure of the same epitoxy technology, and are the same in chip manufacture technology. The standard deviation of the wavelength of the LED wafers is 6>=lambda std>=3, and the light intensity IV standard deviation IV std<=8. The crystal particles are divided into n BINs. The n BINs are divided according to the following dividing rules: at least one BIN constitutes one BIN set, the light intensity of any crystal particle constituting the BIN set conforms to the range IV.avg*(0.95-1.10). The LED standard square sheet and the manufacturing method thereof improve the accuracy and the reliability of correction of an LED wafer testing machine, and improve the effect, the efficiency and the cost of correction or monitoring operation of the testing machine.

Description

technical field [0001] The invention belongs to the field of LED chip manufacturing, in particular to a standard LED chip and a manufacturing method thereof. Background technique [0002] In the field of LED chip manufacturing, high-quality LED wafers or LED packaging devices are usually used to perform consistency calibration and stability monitoring on the testing machine. After confirming that the machine is in good condition, it is put into LED mass production wafer testing. However, the current method of calibrating or monitoring LED wafer testing machines is to use the same or several LED wafers or a set of LED packaging devices to calibrate the consistency between each testing machine and the standard testing machine. However, a single LED wafer is used for the full wavelength band that is difficult to cover for calibration or monitoring components, resulting in partial wavelength bands that are not corrected, and the coefficients obtained by the grain calibration of ...

AI Technical Summary

Problems solved by technology

However, a single LED wafer is used for the full wavelength band that is difficult to cover for calibration or monitoring components, resulting in partial wavelength bands that are not corrected, and the coefficients obtained by the grain calibration of different light intensities will be different, so the light intensity concentration is poor. It will also cause dispersion of calibration coefficients and poor calibration accuracy

At the same time, when calibrating or monitoring the machine, if multiple LED wafers are used as calibrating or monitoring components, and the method of testing several rows of crystal grains through their Mapping is not only difficult to overcome the above-mentioned problem of poor light intensity concentration, but also increases switching Calibration or monitoring parts bring errors in test operation methods

If the calibration or monitoring parts are sampled at fixed intervals, not only will there be differences in the way the LED mass-produced wafers are used for the Mapping measurement, but most of the grains will be detected many times. The problem of thick needle marks on the electrode is not easy to be collected and removed in the post-processing process, resulting in being mixed into good products during sorting, resulting in other abnormal problems in the production process, and the above-mentioned problem of poor light intensity concentration cannot be avoided.

If LED packaging devices are used as calibration or monitoring components, not only the production cost is high, but also there will be light attenuation, especially when the positioning consistency is poor during use, the light-emitting angle deviation will cause errors, and it can only be tested by manual positioning one by one, which is extremely efficient. Low, and at the same time, the difference in form between it and LED mass-produced wafers will also cause errors

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