Semiconductor device

Abstract

A semiconductor device comprising: a first processor; a second processor; a first delay circuit delaying a signal input into the first processor by a predefined number of cycles and inputting the signal into the second processor; a first compression circuit compressing a signal of n-bit width from the first processor into a signal of m-bit width (m<n) and outputting the signal of m-bit width; a second compression circuit compressing a signal of n-bit width from the second processor into a signal of m-bit width and outputting the signal of m-bit width; a second delay circuit delaying the signal from the first compressor by the predefined number of cycles and outputting the delayed signal; and a coincidence comparison circuit comparing bit-wise the corresponding bits of the signals from the second delay circuit and from the second compression circuit to check whether the corresponding bits coincide with each other or not.

Description

[0001] Cross References to Related Applications

[0002] The disclosure of Japanese Patent Application No. 2012-230383 filed on Oct. 18, 2012 including the specification, drawings and abstract of the specification is hereby incorporated by reference in its entirety. technical field

[0003] The present invention relates to a semiconductor device, and more particularly, to a semiconductor device including a processor (CPU core). Background technique

[0004] It is required to quickly and accurately detect errors (failures) of semiconductor devices while the semiconductor devices are operating in order to improve the functional safety of the semiconductor devices and the like. Here, functional safety means the safety achieved by the correct operation of safety functions. For example, there is ISO26262 stipulated by ISO (International Organization for Standardization) as a functional safety standard for in-vehicle electronic devices and the like. As a means for embodying a f...

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