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Phase change memory array stacked structure and operating method thereof

A technology of phase-change memory and stacked structure, which is applied in the field of semiconductors to achieve the effect of protection

Active Publication Date: 2014-06-18
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] In view of the above-mentioned shortcomings of the prior art, the object of the present invention is to provide a phase-change memory array stack structure and its operation method, which are used to solve the problem of increasing the proportion of the area occupied by the memory array in the memory in the prior art, thereby reducing the The problem of chip cost

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  • Phase change memory array stacked structure and operating method thereof
  • Phase change memory array stacked structure and operating method thereof

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Embodiment Construction

[0039] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0040] see Figure 1 to Figure 2 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arbi...

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Abstract

The invention provides a phase change memory array stacked structure and an operating method thereof. The phase change memory array stacked structure at least comprises multiple phase change memory blocks, a global bit line, local bit lines, block bit lines, first strobe gates and second strobe gates, wherein each phase change memory block comprises at least four columns of phase change resistors; the phase change resistors in each column are respectively correspondingly connected with a block bit line; at least two block bit lines are respectively connected with a second strobe gate; at least two second strobe gates are connected to the same local bit line; at least two local bit lines are connected to the global bit line through a first strobe gate. According to the phase change memory array stacked structure, all the block bit lines are connected together in a unified mode through the global bit line, and the maximum load of the global bit line is only determined by the lengths of the block bit lines in the memory blocks, so that parasitic capacitance is greatly reduced. Therefore, large signal delay and high power consumption generated in a high-capacity phase change memory are avoided.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a phase-change memory array stack structure and an operation method thereof. Background technique [0002] Phase Change Memory (PCM, PCRAM) generally refers to random access memory based on a certain chalcogenide thin film. It is a new type of non-volatile memory, which is considered to be the most likely to replace flash memory (Flash) and become the mainstream non-volatile memory in the near future. This is due to its low operating voltage, fast reading speed, bit operation, writing and erasing speed much faster than flash memory, and better fatigue characteristics, which can achieve hundreds of millions of cycles of writing and erasing. The manufacturing process is simple and mature. The CMOS process is compatible, so that its memory cells can be easily scaled down to smaller sizes. [0003] A single phase-change memory cell generally consists of a phase-change resist...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C11/56
Inventor 李喜陈后鹏宋志棠蔡道林王倩
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI