Flexible embedded type tested device simulator

A device under test, embedded technology, applied in simulators, instruments, control/regulation systems, etc., can solve problems such as dependencies, and achieve the effect of improving scalability and simplifying complex logic

Active Publication Date: 2014-08-20
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In view of the above defects in the prior art, the present invention provides an embedded device under test simulator, which receives control commands from the measurement and control host through the VDCP protocol interface based on the TCP/IP network, and completes various

Method used

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  • Flexible embedded type tested device simulator
  • Flexible embedded type tested device simulator
  • Flexible embedded type tested device simulator

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Experimental program
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Embodiment Construction

[0036] First, the meaning of the abbreviations used in the scheme is explained as follows:

[0037] VDCP stands for Virtual Device Communication Protocol

[0038] VDCP-S represents a server (master device) based on the virtual device communication protocol

[0039] VDCP-C represents the client (slave) based on the virtual device communication protocol

[0040] The technical scheme adopted by the present invention includes two levels: one is the embedded device simulator itself, and the other is the communication protocol framework between devices, that is, the virtual device communication protocol VDCP. At the hardware level, in order to make the device under test simulate the electronic objects under test in various measurement and control fields as much as possible, the VxWorks embedded system based on PCI or CPCI bus is adopted, and most of the measurement and control system and the device under test can be realized by using the PCI bus. function, using the VxWorks system...

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Abstract

The invention discloses a flexible embedded type tested device simulator, and particularly provides a Virtual Device Communication Protocol (VDCP) beneficial to flexible design of the measurement and control field. The embedded tested simulator is composed of an embedded main control unit, analog quantity and digital quantity input units, analog quantity and digital quantity output units, a measurement and control bus unit and a display unit. According to the embedded tested device simulator, an excitation receiving module of a tested device is simulated through the input units, a response output module of the tested device is simulated through the output units, the communication mode based on a TCP/IP network between a measurement and control host and an embedded type sub device is standardized through the VDCP, the problem that in the measurement and control field, research of a measurement and control system depends on an electronic tested device too much is solved, the lead time of the measurement and control device is greatly shortened, the development cost of the measurement and control device is greatly reduced, and expandability and reusability of the measurement and control system are also improved.

Description

technical field [0001] The invention relates to the technical field of electronic equipment measurement and control, and proposes a flexible embedded device simulator under test, in particular a virtual device communication protocol (VDCP) on it. Background technique [0002] In the research and development process of the measurement and control system, it is necessary to inject various forms of excitation signals into the object under test and read the excitation response of the object under test to verify whether the test system can accurately generate and send excitation signals, and whether it can receive and analyze response signals . The existing method is to make a real device under test, inject an excitation signal into it, and collect its feedback signal, so as to judge whether the function of the measurement and control system is correct. A disadvantage of this method is that the research and development investment is large, the development cycle is prolonged, and...

Claims

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Application Information

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IPC IPC(8): G05B17/02
Inventor 范建新肖瑾余正伟吴冰张朔
Owner BEIHANG UNIV
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