High current electron beam small-section optical fiber YAG probe detection device

Abstract

The invention discloses a high current electron beam small-section optical fiber YAG probe detection device. The high current electron beam small-section optical fiber YAG probe detection device comprises a high vacuum cavity, an optical fiber YAG feeler pin, a flexible optical cable, an image output detection device and a probe horizontal motion positioning device. The cavity is transversely placed, the front end of the cavity is used for being connected with a detected electron beam drift tube, and the rear end of the cavity is used for containing the probe horizontal motion positioning device. The probe horizontal motion positioning device is inserted into the high vacuum cavity from the rear end of the high vacuum cavity and is fixedly connected with the feeler pin, and then the front end of the feeler pin can be right opposite to the detected electron beam drift tube and is axially positioned and moves along the high vacuum cavity. The feeler pin is connected to the image output detection device located outside the high vacuum cavity through the flexible optical cable. The image output detection device is used for acquiring current intensity distribution of electron beams, moving in the detected electron beam drift tube, on the front end face of the optical fiber YAG feeler pin, and the current intensity distribution is converted into optical images. According to the device, electron beams with the diameter of an electron transmission channel ranging from below 10 mm to about 1 mm can be measured.

Description

technical field [0001] The invention relates to the technical field of microwave devices or high-current electron beam analyzers to detect electron guns and electron optical properties in the electron beam transmission process, in particular to the ultra-high frequency microwave vacuum device electron beam drift tube with a small channel electron beam whose diameter is below several millimeters detection technology. Background technique [0002] figure 1 It is a schematic diagram of the structure of the traditional small electron beam cross-section measurement system used in the high-current electron beam analyzer of microwave electric vacuum devices. The system utilizes a high-current electron beam to directly bombard a fluorescent screen or a YAG screen for detection. figure 2 is a schematic diagram of the fluorescent screen probe head mechanism of the measurement system. [0003] Such as figure 1 and figure 2 As shown, the measurement system is placed vertically, a...

AI Technical Summary

Problems solved by technology

[0004] Today, as the microwave frequency requirements are getting higher and higher, the diameter of the electron beam and the channel of the electron beam drift tube in the device are becoming thinner and thinner. Probing of drift tubes with a diameter of several millimeters

[0005] Secondly, since the diameters of the electron beam drift tube and the electron beam in the device are very close, both of which are on the order of millimeters, the reflection of the bright light emitted on the fluorescent screen at the probe on the drift tube wall also affects the light intensity measurement of the cross-sectional light image of the electron beam on the fluorescent screen.

What is more troublesome is that the optical image of the fluorescent screen probe is transmitted from the vacuum cavity, and the required optical channel is a straight line in vacuum, so the synchronous movement mechanism of the required vacuum cavity and detection equipment is long and complicated, and the measurement process is too long. The image distortion brought by the optical instrument with long focal length greatly affects the spatial resolution of the electron beam on the measuring phosphor screen.

Images