Preparation method of nano-twinned copper rewiring

A technology of nano-twinned copper and rewiring, applied in semiconductor/solid-state device manufacturing, electrical components, electrical solid-state devices, etc., to achieve high thermomechanical reliability, low current density, and excellent comprehensive mechanical properties

Active Publication Date: 2017-09-01
SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] In view of the above, there is currently no publication of any technology for pulse-plated nano-twinned copper redistribution compatible with wafer-level processes

Method used

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  • Preparation method of nano-twinned copper rewiring
  • Preparation method of nano-twinned copper rewiring
  • Preparation method of nano-twinned copper rewiring

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Embodiment Construction

[0032] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.

[0033] see figure 1 . It should be noted that the diagrams provided in this embodiment are only schematically illustrating the basic idea of ​​the present invention, and only the components related to the present invention are shown in the diagrams rather than the number, shape and shape of the components in actual implementation. Dimensional drawing, the type, quantity and proportion of each component can be changed arbitrarily duri...

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Abstract

The invention provides a method for preparing nano-twinned copper rewiring, comprising the steps of: 1) preparing a passivation layer on a substrate, and photoetching a window for interconnection with a chip plate; 2) forming a passivation layer on the surface of the passivation layer and A seed layer is formed in the interconnection window; 3) a photoresist pattern of nano-twinned copper rewiring is formed on the surface of the seed layer, and a layer of nano-twinned copper rewiring layer is prepared on the surface of the exposed seed layer by pulse electroplating; 4 ) to remove the photoresist pattern and etch away the excess seed layer. The invention adopts pulse electroplating supplemented by rapid annealing treatment, relies on the large internal stress formed by pulse electroplating to drive copper recrystallization, and forms high-density nano twins for rewiring. The current density adopted by the present invention is low, the current equipment can be used, and it is fully compatible with the existing IC technology, belongs to the wafer-level packaging technology, has high efficiency and low cost. The prepared nano-twinned copper has excellent comprehensive mechanical properties, can greatly reduce the rewiring size to about 10um, and has high thermomechanical reliability.

Description

technical field [0001] The invention belongs to the field of semiconductor packaging, in particular to a preparation method of nano-twinned copper rewiring. Background technique [0002] Wafer-level packaging means that chips and packages are manufactured and tested on the wafer, and finally diced. The first step of wafer-level packaging is to expand the pitch of standard IC pads through rewiring technology, and then perform low-cost ball planting to increase the pitch and size of solder balls, ensuring higher board-level reliability. [0003] Rewiring technology is the core process of wafer level packaging, which directly determines the excellent packaging performance. Compared with the chip size, the rewiring distance is often longer and has larger parasitic effects. Rewiring often requires a turn in the routing direction to coordinate other solder joints and wiring to achieve high-density packaging. Rewiring needs to be connected with solder balls through UBM, which be...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/60H01L23/485
Inventor 李珩罗乐朱春生叶交托徐高卫
Owner SHANGHAI INST OF MICROSYSTEM & INFORMATION TECH CHINESE ACAD OF SCI
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