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Capacitance detection method and system

A detection method and detection system technology, applied in the electronic field, can solve problems such as low efficiency and long test time

Active Publication Date: 2015-03-25
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Based on this, it is necessary to provide a capacitance detection method and system for the long test time and low efficiency of the above-mentioned constant current discharge method

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  • Capacitance detection method and system
  • Capacitance detection method and system
  • Capacitance detection method and system

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Embodiment Construction

[0025] In order to make the purpose, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0026] see figure 1 , figure 1 It is a schematic flow chart of the first embodiment of the capacitance detection method of the present invention.

[0027] The capacitance detection method comprises the following steps:

[0028] Step S101, carry out short-circuit discharge for N minutes to each capacitor to be tested, wherein the circuit of short-circuit discharge includes a capacitor to be tested and an equivalent series resistance, and the discharge time consumed when the short-circuit discharge current of N and the sample capacitor is approximately zero Correspondingly, the sample capacitor and the capacitor to be tested are capacitors of the same type made of the same material.

[0029] Step S102, charging each capacitor under test after short-circuit disch...

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Abstract

The invention discloses a capacitance detection method and system. The method includes the steps that short-circuit discharge is conducted on capacitors to be measured for N minutes; the capacitors to be measured after short-circuit discharge are charged, charging time consumed when the voltage of the capacitors to be measured is 0.632 of the rated voltage is detected, and the charging time of the capacitors to be measured is generated; the capacitance acquired by dividing the charging time of the capacitors to be measured by the resistance of equivalent series resistors is acquired and serves as the preliminary survey capacitance of the capacitors to be measured; the detection capacitance of the capacitors to be measured is generated by adding the preliminary survey capacitance of the capacitors to be measured and the corrected capacitance, wherein the corrected capacitance is the difference value of the capacitance acquired after short-circuit discharge is conducted on the sample capacitors for N minutes and the capacitance acquired after the sample capacitors are discharged for 30 minutes. By the implementation of the method and system, capacitance detection time of the capacitors can be greatly shortened, and capacitance detection efficiency is improved.

Description

【Technical field】 [0001] The invention relates to the field of electronic technology, in particular to a capacitance detection method and system. 【Background technique】 [0002] Supercapacitor is a new type of energy storage device. Unlike conventional capacitors, its capacity can reach farad level or even tens of thousands of farad. It has the characteristics of small internal resistance, large charge and discharge current, high charge and discharge efficiency (90% to 95%), long cycle life (tens of thousands to one hundred thousand times), and no pollution. Its specific power and specific energy are between conventional capacitors and rechargeable batteries, making up for the defects of conventional energy storage devices in many application fields. Due to the fast charging and discharging of supercapacitors, there are more and more applications in systems that need to provide high-power buffering and hybrid power in a short time. [0003] The standard test method for tes...

Claims

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Application Information

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IPC IPC(8): G01R27/26
Inventor 刘晓臣
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH