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Testing system and method for critical current density of high temperature superconductor film material

A critical current density, high temperature superconducting thin film technology, applied in the current density measurement, magnetic property measurement and other directions, can solve the problems of inability to quickly detect multi-point critical current density, unable to completely replace, etc., to achieve the test method is simple, feasible and suitable The effect of promotion and large amount of data

Inactive Publication Date: 2015-04-22
JILIN UNIV
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

Therefore, it cannot completely replace the four-point method
However, none of the commonly sold four-point method test systems can be used for rapid detection of multi-point critical current density on large-area superconducting thin film samples.

Method used

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  • Testing system and method for critical current density of high temperature superconductor film material
  • Testing system and method for critical current density of high temperature superconductor film material
  • Testing system and method for critical current density of high temperature superconductor film material

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Embodiment Construction

[0036] The specific implementation manners of the present invention will be further described below in conjunction with the accompanying drawings.

[0037] The following takes YBCO high temperature superconducting thin film material as an example to illustrate the specific construction method and testing method.

[0038] The nanovoltmeter uses Keithiley2182A nanovoltmeter, and the programmable DC power supply uses DP831A programmable linear DC power supply. The fixed board 1 is made of plexiglass, the shell 2 is made of aluminum, the test board 3 is a square printed circuit board (PCB circuit board), the probe board 4 is made of plastic, and the probe is P50-J1 of Kaida Electronics. type probe.

[0039] Testing system for critical current density of high temperature superconducting thin film materials, such as image 3 As shown, it includes a computer, a nanovoltmeter, a programmable DC current source and a probe station;

[0040] Fixed plate 1 is a square structure, such as...

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Abstract

The invention belongs to the field of testing of high temperature superconductor material performance, and particularly relates to a testing system and method for the critical current density of a high temperature superconductor film material. The system is composed of a computer, a nano-volt meter, a programmable direct-current power source and a probe station. The sample is fixed to the probe table and placed inside liquefied nitrogen, the computer controls the programmable direct-current power source to provide a current signal, the measurement value of the nano-volt meter and the output value of the programmable direct-current power source are recorded in real time, and therefore data recording and drawing are automatically completed. The testing system and method have the advantages that large-area samples can be rapidly measured in a multi-point mode and do not need to be taken out of the liquefied nitrogen any more when different micro-bridges are tested, a wire for connecting the nano-volt meter with the current source on a testing board is changed to different round hole base female headers on the testing board, namely different testing points, and therefore testing efficiency is greatly improved.

Description

technical field [0001] The invention belongs to the field of performance testing of high-temperature superconducting thin-film materials, and in particular relates to a testing system and a testing method for critical current density of high-temperature superconducting thin-film materials. Background technique [0002] Since the discovery of superconducting materials in the liquid nitrogen temperature zone in 1986, high temperature superconducting materials (High Temperature Superconductor, referred to as HTS) and their applications have developed rapidly. The application of HTS can be divided into the application in the field of strong current and the application in the field of weak current. Applications in the field of weak electricity include the use of HTS's low microwave surface resistance, which can be used to develop high-performance microwave passive devices, such as microwave transmission lines, filters, resonators, delay lines, etc., some of which are very close t...

Claims

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Application Information

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IPC IPC(8): G01R19/08G01R33/12
Inventor 李国兴张宝林郭峰汪薪生
Owner JILIN UNIV
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