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A dual-probe low-noise test method for ultrafast transient electrical response signals

A technology that responds to signals and test methods, applied in the field of electrical measurement, can solve problems such as the inability to measure the physical process of devices

Inactive Publication Date: 2017-07-28
FUDAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, in specific work, we found that if we simply use these extremely sensitive high-parameter commercial equipment directly on the basis of the traditional single-probe measurement circuit, it will result in a lot of high-frequency noise signals in the measurement, so it is impossible to analyze the physical properties of the device. Processes are reliably measured

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  • A dual-probe low-noise test method for ultrafast transient electrical response signals
  • A dual-probe low-noise test method for ultrafast transient electrical response signals
  • A dual-probe low-noise test method for ultrafast transient electrical response signals

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Embodiment Construction

[0019] For the convenience of understanding, a specific measurement example is described below in combination with schematic diagrams and measurement data.

[0020] In this specific measurement experiment, a pulsed laser is used as a pulsed excitation signal to measure an organic optoelectronic device (a structure of indium tin oxide, 500 nanometers thick N , N′ -Di(1-naphthyl)- N , N′ -Diphenyl-1, 1′-biphenyl-4-4′-diamine ( N , N '-Di-[(1-naphthyl)- N , N '-diphenyl]-1,1'-biphenyl)-4,4'-diamine , NPB) film, 20 nm thick silver film) transient voltage response. The oscilloscope used in the experiment is DPO71254C of Tektronix, and the two probes are P6245 active voltage probes of Tektronix. The pulsed laser is a Brio laser from Quantel. The test system (oscilloscope and probe) is synchronized with the pulsed laser through the trigger signal generated by the laser to ensure that the measurement starts at the time when the laser is emitted.

[0021] First, as a control g...

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Abstract

The invention belongs to the technical field of electrical measurement, in particular to a double-probe low-noise testing method for ultrafast transient electrical response signals. The present invention uses two voltage test probes of the same type to respectively measure the two electrodes of the device to be tested; the relative position of each voltage probe and the two electrodes of the device to be tested is fixed by a fixing device; thereby accurately measuring the response of the device to the pulse excitation signal Fast current or voltage response. If a more sensitive (high bandwidth, sampling rate) oscilloscope and probe are used in the traditional single-probe measurement method, high-frequency noise signals will be introduced, which will seriously affect the quality of the measurement results. The method of the present invention avoids this problem, thus allowing the current or voltage response of the device to be measured at a higher bandwidth and sampling rate.

Description

technical field [0001] The invention belongs to the technical field of electrical measurement, and in particular relates to a testing method for an ultrafast transient electrical response signal. Background technique [0002] When studying the microscopic physical processes inside electronic functional devices (such as photovoltaic cells, memory devices, piezoelectric devices, pyroelectric devices, etc.), it is often necessary to measure the device's response to external pulse excitation signals (suddenly applied force, heat, light or electrical signals, etc.) ) of the transient electrical response (both voltage and current). Such devices typically contain two electrodes for input or output of electrical signals (voltage or current). In past studies, it was common to ground one of the device's two electrodes and then use an oscilloscope and a voltage or current probe to measure the electrical signal from the other electrode. For a long time in the past, limited by the meas...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 陈小青侯晓远
Owner FUDAN UNIV