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A plasma spray mass spectrometry ionization source

A plasma and low-temperature plasma technology, applied in the field of mass spectrometry ionization sources, can solve problems such as increasing energy consumption, and achieve the effects of easy fabrication and processing, reducing energy consumption, improving ionization efficiency and instrument detection sensitivity

Active Publication Date: 2017-03-22
KUSN HEXIN MASS PECTRUM TECH +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the existing plasma spray mass spectrometer ionization source, the low-temperature plasma jet device and the mass spectrometer port are on the same side and the distance is relatively close, and there is an effect of a radio frequency electric field. The ionized sample molecules need to be repelled by the electrode before they can enter the mass spectrometer port and be detected. thereby increasing energy consumption

Method used

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  • A plasma spray mass spectrometry ionization source
  • A plasma spray mass spectrometry ionization source
  • A plasma spray mass spectrometry ionization source

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Embodiment 1

[0038] This embodiment provides a plasma spray mass spectrometry ionization source, the structure of the ionization source is as follows Figure 1-Figure 3 As shown, it includes a sampling device and a low-temperature plasma jet device.

[0039] Such as figure 2 As shown, the sampling device includes a sampling tube, a tee fitting 9 connected with the sampling tube, and a heating device 6, and the heating device 6 is coated on the outside of the tee fitting 9 for heating liquid samples. Specifically, the heating device 6 is an electric heating wire, and the outer layer is wrapped with thermal insulation cotton; the nozzle 7 of the metal nozzle 21 of the three-way pipe fitting 9 is located directly in front of the mass spectrometer port 19, and the distance between the two ports is 5mm.

[0040] Wherein the sampling tube includes a liquid sampling tube 2 and a gas sampling tube 20; the nozzle 7 of the three-way pipe fitting 9 is a liquid outlet end, and is provided with an in...

Embodiment 2

[0049] This embodiment provides a plasma spray mass spectrometry ionization source, the structure of the ionization source is as follows Figure 1-Figure 3 As shown, it includes a sampling device and a low-temperature plasma jet device.

[0050] Such as figure 2 As shown, the sampling device includes a sampling tube, a tee pipe fitting 9 communicated with the sampling tube, and a heating device 6. Specifically, the heating device 6 is an electric heating wire, and the outer layer is wrapped with thermal insulation cotton; The heating device 6 is coated on the outside of the three-way pipe fitting 9, and is used for desolventizing the heated liquid sample. The nozzle 7 of the metal nozzle 21 of the three-way pipe fitting 9 is located directly in front of the mass spectrometer port 19, and the distance between the two ports is 3mm.

[0051] Wherein the sampling tube comprises a liquid sampling liquid sampling tube 2, a gas sampling tube 20 and a heating device 6. The metal noz...

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Abstract

The invention discloses a plasma spray spectrometry ionization source. The plasma spray spectrometry ionization source comprises a low-temperature plasma jet device and a sample feeding device; the air exporting end of an insulating medium chamber of the low-temperature plasma jet device is close to a metal spray pipe of a three-way pipe of the sample feeding device and is vertical to the metal spray pipe; the insulating medium chamber is close to one side of an air sample feeding pipe; the sample sprayed out through a nozzle of the metal spray pipe of the three-way pipe can be molecularly ionized under the indirect effect of plasma jet. The plasma spray spectrometry ionization source is high in ionization efficiency, and can avoid the effect of a radio frequency electric field and reduce the energy consumption.

Description

technical field [0001] The invention relates to the technical field of mass spectrometry ionization sources, in particular to a plasma spray mass spectrometry ionization source for analyzing liquid or gas samples. Background technique [0002] Among the existing plasma spray mass spectrometer ionization sources, the low-temperature plasma technology developed for many years has a huge impact on the development of high-tech economy and the transformation of traditional industries. Plasma technology has been applied in the semiconductor industry, polymer film, material anti-corrosion, plasma electronics, plasma synthesis, plasma metallurgy, plasma coal chemical industry, and plasma waste treatment. In recent years, with the research on plasma technology, this technology has gradually begun to be applied to the field of sample ionization for mass spectrometry detection. Plasma can produce many active components, including ultraviolet and visible photons, electrons, ions, free ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/16
CPCH01J49/165
Inventor 刘吉星张建军朱辉程平黄正旭高伟董俊国周振
Owner KUSN HEXIN MASS PECTRUM TECH