Plasma spray spectrometry ionization source

A technology of plasma and low-temperature plasma, which is applied in the field of mass spectrometry ionization source, can solve the problems of increasing energy consumption and achieve the effects of easy production and processing, expanded application range, and good heat insulation performance

Active Publication Date: 2015-05-13
KUSN HEXIN MASS PECTRUM TECH +2
9 Cites 7 Cited by

AI-Extracted Technical Summary

Problems solved by technology

[0003] In the existing plasma spray mass spectrometer ionization source, the low-temperature plasma jet device and the mass spectrometer port are on the same side and the distance is relatively close, and there is a...
View more

Method used

Liquid analysis sample is introduced into liquid sampling pipe 2 through liquid sampling device 1, and now gas sampling device 4 is auxiliary gas high-purity N , auxiliary gas forms the sheath through liquid sampling pipe 2 and tee fitting 9 The air layer forms a sample ...
View more

Abstract

The invention discloses a plasma spray spectrometry ionization source. The plasma spray spectrometry ionization source comprises a low-temperature plasma jet device and a sample feeding device; the air exporting end of an insulating medium chamber of the low-temperature plasma jet device is close to a metal spray pipe of a three-way pipe of the sample feeding device and is vertical to the metal spray pipe; the insulating medium chamber is close to one side of an air sample feeding pipe; the sample sprayed out through a nozzle of the metal spray pipe of the three-way pipe can be molecularly ionized under the indirect effect of plasma jet. The plasma spray spectrometry ionization source is high in ionization efficiency, and can avoid the effect of a radio frequency electric field and reduce the energy consumption.

Application Domain

Ion sources/guns

Technology Topic

IonizationPhysics +10

Image

  • Plasma spray spectrometry ionization source
  • Plasma spray spectrometry ionization source
  • Plasma spray spectrometry ionization source

Examples

  • Experimental program(2)

Example Embodiment

[0037] Example one:
[0038] This embodiment provides a plasma spray mass spectrometry ionization source. The structure of the ionization source is as follows Figure 1-Figure 3 As shown, it includes a sampling device and a low-temperature plasma jet device.
[0039] Such as figure 2 As shown, the sampling device includes a sampling tube, a three-way pipe 9 communicating with the sampling pipe, and a heating device 6. The heating device 6 is wrapped around the three-way pipe 9 for heating liquid samples Specifically, the heating device 6 is an electric heating wire wrapped with insulating cotton; the nozzle 7 of the metal nozzle 21 of the three-way pipe 9 is located directly in front of the mass spectrometer port 19, and the two ports are 5 mm apart.
[0040] The sampling tube includes a liquid sampling tube 2 and a gas sampling tube 20; the nozzle 7 of the tee fitting 9 is a liquid lead-out end with an inwardly contracting opening structure; the outer wall of the liquid sampling tube 2 and the inner wall of the tee fitting 9 Form a sheath gas layer.
[0041] The liquid analysis sample is introduced into the liquid sampling tube 2 through the liquid sampling device 1, and the gas sampling device 4 is auxiliary gas high purity N 2 , The auxiliary gas passes through the sheath gas layer formed by the liquid sampling tube 2 and the three-way tube 9 and forms a sample spray 8 together with the liquid sample at the nozzle 7. The temperature of the heating device 6 is controllable, and the heating temperature is set by the heating device 6 to remove the solvent contained in the sample and improve the ionization efficiency of the sample.
[0042] As a preferred solution, one end of the liquid sampling tube 2 extends out of the liquid introduction end of the three-way tube 9 and is connected to the liquid sampling device 1, and the other end extends out of the nozzle 7 of the three-way tube 9, and the liquid sampling tube 2 The length of the end outside the nozzle 7 of the three-way pipe 9 is in the range of 0-1mm. The liquid sampling tube 2 is a fused silica capillary with an outer diameter of 0.19mm and an inner diameter of 0.1mm; the liquid of the three-way pipe 9 A liquid sampling tube seal 3 is provided between the liquid sampling tube 2 at the introduction end and the liquid introduction end of the three-way pipe 9; between the gas sampling tube 20 at the gas introduction end of the three-way pipe 9 and the gas introduction end of the three-way pipe 9 A gas sampling seal 4 is installed between.
[0043] One end of the gas sampling tube 20 extends into the three-way pipe 9 and communicates with the sheath gas layer, and the other end extends out of the three-way pipe 9 and is connected to the gas sampling device 4, which is At the gas sample introduction end, the gas sampling tube 20 is used for passing auxiliary carrier gas or gas samples for analysis, and the gas sampling tube 20 is a 1/16 Teflon FEP tube.
[0044] When the liquid sample is injected, the liquid sample is introduced through the liquid sampling tube 2. At this time, the gas sampling tube 20 is fed with high-purity nitrogen as the carrier gas. When the gas is injected, the gas sample is introduced through the gas sampling tube 20, and the liquid is injected The sample tube 2 can introduce some functional gases or liquids (H2, H2O), or it can be left unused.
[0045] Such as image 3 As shown, the low-temperature plasma jet device includes an insulating medium cavity 12, a discharge electrode, a gas duct 17, a discharge gas introduction device 11, and a power supply 16, wherein the discharge electrode includes an inner electrode 13 and an outer electrode 14. The insulating medium cavity 12 is a quartz glass tube with an inner diameter of 1.5 mm and a length of 100 mm. The insulating medium cavity 12 has a gas outlet end 18 at one end, and a cavity structure sealed by the sealing device 10 at the other end. The gas outlet end 18 shrinks inwardly, the gas outlet end 18 shrinks inwardly, and the air duct 17 One end extends into the sealing device 10 and is connected to one end of the insulating medium cavity 12, and the other end extends out of the sealing device 10 to connect to the discharge gas introduction device 11; the gas outlet end 18 of the insulating medium cavity 12 is connected to the third of the sampling device The through pipes 9 are orthogonal, the distance between the gas outlet end 18 of the insulating medium cavity 12 and the metal nozzle 21 of the three-way pipe 9 of the sampling device is 1-2 mm and perpendicular to each other. The insulating medium cavity 12 is close to the sample The axial distance between one side of the pipe and the nozzle 7 of the three-way pipe 9 is 8 mm, and the radial distance is 15 mm. The inner electrode 13 is a tungsten rod with a diameter of 1mm and a length of 120mm; the inner electrode 13 is located on the central axis of the insulating medium cavity 12, one end of the inner electrode 13 is connected to one end of the power supply 16, and the other end of the inner electrode 13 is located in the insulating medium cavity 12, and the distance from the lead-out port of the insulating medium cavity 12 is 3-10mm, in this embodiment, the distance is 9mm. The outer electrode 14 is a ring electrode, and the material is a copper strip with a thickness of 1 mm and a length of 15 mm. The outer electrode 14 is wrapped on the outside of the insulating medium 12, and the outer electrode 14 is connected to the other end of the power supply 16 and is 5 mm away from the leading end of the insulating medium cavity 12.
[0046] In this embodiment, as a preferred solution, the power supply 16 includes an inner electrode 13 and an outer electrode 14. The power supply 16 is a high-voltage radio frequency dielectric barrier power supply with a frequency of 0.5-500KHz, a peak voltage of 220-80000V, and a working power of 2. -50W. The discharge gas introduced into the discharge gas introduction device 11 is helium, and the flow rate of the helium gas is 310ml/min. When the helium gas flows out from the leading end of the insulating medium cavity 12 through the insulating medium cavity 12, it passes through the inner electrode 13 and the outer electrode The discharge area is composed of 14, and the discharge voltage applied on the discharge electrode ionizes helium to generate helium plasma. Under the action of the airflow, the helium plasma flows out of the discharge area with the airflow to form a plasma jet 15, plasma jet 15 and sampling device The three-way pipe 9 is in contact. When the plasma jet 15 is in contact with the three-way tube 9, the high-energy active components in the plasma interact with the metal surface of the metal nozzle 21 of the three-way tube 9, and the electrons on the metal surface are excited or surface plasmon resonance forms surface plasma Excimer, in this way, due to the inwardly contracted opening structure of the nozzle 7, the charge distribution on the metal surface is uneven. When the liquid sample passes through the nozzle 7, charge transfer or arc discharge occurs to ionize the sample molecules.
[0047] In this embodiment, the low-temperature plasma jet device and the mass spectrometer port 19 are not on the same side and are far apart, so there is no radio frequency electric field. The ionized sample molecules can enter the mass spectrometer port for detection without acting on the repelling electrode. This reduces energy consumption.

Example Embodiment

[0048] Example two
[0049] This embodiment provides a plasma spray mass spectrometry ionization source. The structure of the ionization source is as follows Figure 1-Figure 3 As shown, it includes a sampling device and a low-temperature plasma jet device.
[0050] Such as figure 2 As shown, the sampling device includes a sampling tube, a three-way pipe 9 communicating with the sampling tube, and a heating device 6. Specifically, the heating device 6 is an electric heating wire, and the outer layer is wrapped with insulating cotton; The heating device 6 is wrapped around the three-way pipe 9 and is used to heat the liquid sample for desolvation. The nozzle 7 of the metal nozzle 21 of the three-way pipe 9 is located directly in front of the mass spectrometer port 19, and the two ports are 3 mm apart.
[0051] The sampling tube includes liquid sampling liquid sampling tube 2, gas sampling tube 4 and heating device 6 three-way pipe fittings 9 nozzle metal nozzle 21 7 is the lead-out end, with an inwardly contracting opening structure; The outer wall of the sample tube 2 and the inner wall of the three-way pipe 9 form a sheath gas layer.
[0052] As a preferred solution, one end of the liquid sampling tube 2 extends out of the liquid introduction end of the three-way tube 9 and is connected to the liquid sampling device 1, and the other end extends out of the nozzle 7 of the three-way tube 9, and the liquid sampling tube 2 The length of the end outside the nozzle 7 of the three-way pipe 9 is in the range of 0-1mm. The liquid sampling tube 2 is a fused silica capillary with an outer diameter of 0.19mm and an inner diameter of 0.1mm; the liquid introduction end of the three-way pipe 9 A liquid sampling tube seal 3 is arranged between the liquid sampling tube 2 and the liquid introduction end of the three-way pipe 9; a gas sampling tube 20 at the gas introduction end of the three-way pipe 9 is arranged between the gas introduction end of the three-way pipe 9 Gas sampling seal 4.
[0053] One end of the gas sampling tube 20 extends into the three-way pipe 9 and communicates with the sheath gas layer, and the other end extends out of the three-way pipe 9 and is connected to the gas sampling device 4, which is At the gas sample introduction end, the gas sampling tube 20 is used to pass in auxiliary carrier gas or gas samples for analysis, and the gas sampling tube 20 is a 1/16 Teflon FEP tube.
[0054] When the gas sample is injected, the syringe 1 and the liquid sampling tube 2 can be left unused, or functional liquid or gas can be introduced. The gas sample directly enters the sheath gas layer formed by the liquid sampling tube 2 and the three-way pipe 9 through the gas device 4, and is ejected from the nozzle 7.
[0055] Such as image 3 As shown, the low-temperature plasma jet device includes an insulating medium cavity 12, a discharge electrode, a discharge gas introduction device 11, and a power supply 16, wherein the discharge electrode includes an inner electrode 13 and an outer electrode 14. The insulating medium cavity 12 is a ceramic tube with an inner diameter of 2 mm and a length of 100 mm. The insulating medium cavity 12 has a gas outlet end 18 at one end, and a cavity structure sealed by the sealing device 10 at the other end. The gas outlet end 18 shrinks inwardly, and the gas outlet end 18 has an inwardly shrinkable opening structure; the air duct 17 One end extends into the sealing device 10 and is connected to one end of the insulating medium cavity 12, and the other end extends out of the sealing device 10 to connect to the discharge gas introduction device 11; the gas outlet end 18 of the insulating medium cavity 12 is connected to the third of the sampling device The through pipe 9 is perpendicular and perpendicular, and the axial distance from the nozzle 7 of the three-way pipe 9 is 8 mm, and the radial distance is 15 mm. The discharge electrode includes an inner electrode 13 and an outer electrode 14. The inner electrode 13 is a tungsten rod with a diameter of 1.5 mm and a length of 120 mm. The inner electrode 13 is located on the central axis of the insulating medium cavity 12, and a section of the inner electrode 13 is connected to one end of the power supply 16. The other end of the inner electrode 13 is located in the insulating medium cavity 12 and is 9 mm away from the lead-out port of the insulating medium 12. The outer electrode 14 is a ring electrode, made of copper tape, with a thickness of 2 mm and a length of 25 mm. The outer electrode 14 is wrapped on the outside of the insulating medium 12, and the outer electrode 14 is connected to the other end of the power supply 16 and is separated from the gas outlet end 18 of the insulating medium cavity 12 by 2 mm. The power supply 16 supplies power for the inner electrode 13 and the outer electrode 14. The power supply 16 is a high-voltage radio frequency dielectric barrier power supply with a frequency of 0.5-500KHz, a peak voltage of 220-80000V, and a working power of 2-50W. The discharge gas introduced into the discharge gas introduction device 11 is helium with a flow rate of 410 ml/min. When helium passes through the insulating medium cavity 12 and flows out from the gas outlet end 18 of the insulating medium cavity 12, it passes through the inner electrode 13 and the outer The discharge area formed by the electrode 14. The discharge voltage applied to the discharge electrode ionizes helium to generate helium plasma. Under the action of the air flow, the helium plasma flows out of the discharge area with the air flow to form a plasma jet 15, which is combined with the sample The metal nozzle 21 of the three-way pipe 9 of the device is in contact. When the plasma jet 15 is in contact with the metal nozzle 21, the high-energy active components in the plasma interact with the metal surface at the nozzle 7 end of the three-way pipe 9 and the electron excitation or surface plasmon resonance on the metal surface forms surface plasmons. In this way, due to the inwardly contracted opening structure of the nozzle 7, the charge distribution on the metal surface is uneven. When the gas sample passes through the nozzle 7, charge transfer or arc discharge occurs to ionize the sample molecules.
[0056] In this embodiment, the low-temperature plasma jet device and the mass spectrometer port 19 are not on the same side and are far apart, so there is no radio frequency electric field. The ionized sample molecules can enter the mass spectrometer port for detection without acting on the repelling electrode. This reduces energy consumption.

PUM

PropertyMeasurementUnit
Outer diameter0.19mm
The inside diameter of0.1mm
Diameter1.0 ~ 2.0mm

Description & Claims & Application Information

We can also present the details of the Description, Claims and Application information to help users get a comprehensive understanding of the technical details of the patent, such as background art, summary of invention, brief description of drawings, description of embodiments, and other original content. On the other hand, users can also determine the specific scope of protection of the technology through the list of claims; as well as understand the changes in the life cycle of the technology with the presentation of the patent timeline. Login to view more.

Similar technology patents

Continuous slurry polymerization volatile removal

InactiveUS6858682B2increase ethylene concentrationreduce energy consumption
Owner:EXXONMOBIL CHEM PAT INC

Wireless sensor network node device used in underground coal mine

InactiveCN101621431AReduce energy consumptionextended life cycle
Owner:CHINA UNIV OF MINING & TECH

Classification and recommendation of technical efficacy words

  • Reduce energy consumption

Preparation method of high-strength hydrogel

InactiveCN103739861AThe preparation process takes a short timeReduce energy consumption
Owner:HENAN POLYTECHNIC UNIV

Catalyst for gas phase hydrogenation of acetic acid to prepare ethanol

Owner:DALIAN INST OF CHEM PHYSICS CHINESE ACAD OF SCI +1

Wireless emergency lighting system

ActiveUS8491159B2ease of installationreduce energy consumption
Owner:RING LLC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products