A Method for Discriminating Protons and Alpha Particles Using a Fully Depleted Silicon Detector

Abstract

The invention provides a method for identifying a proton or an alpha particle with a fully-depleted silicon detector. The method is characterized by comprising the following steps: injecting a particle to be detected into the fully-depleted silicon detector, and recording energy E of the particle and the frequency spectrum of an obtained pulse signal; calculating an identification parameter k according to the amplitude ratio of a harmonic wave component to a direct current component at 7.8 MHz in the frequency spectrum of the pulse signal; taking the energy E as an abscissa and taking the identification parameter k of the particle as an ordinate to obtain a point in a plain; if the point is above an identification straight line tau, identifying that the particle is the alpha particle; if the point is below the identification line tau, identifying that the particle is the proton. Compared with the conventional time-domain identification method, the method provided by the invention needs no dedicated de-noising processing, and is higher in anti-noise capability and proton / alpha particle identification performance.

Description

technical field [0001] The invention belongs to the technical field of charged particle detection, and relates to a method for using a fully depleted silicon detector to discriminate protons and alpha particles by analyzing its frequency domain characteristics. Background technique [0002] The identification of charged particles is an important basis for space radiation protection, space environment monitoring, particle event prediction, space science exploration and research, and an important guarantee for nuclear physics experiments and nuclide analysis. Traditional charged particle screening methods are mainly detector telescope method, time-of-flight method, magnetic analysis method and electrostatic analysis method, etc., see "Experimental Methods of Nuclear Physics", Beijing: Atomic Energy Press, 1985. The detector telescope method and the time-of-flight method have been applied to many detectors because of their simple equipment and better identification effects. Bu...

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Problems solved by technology

At present, there is no public literature related to the use of FRA (Frequency Ratio Analysis, Frequency Ratio Analysis) method to carry out charged particle screening by using a fully depleted silicon detector.

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