Machine Vision Based Wafer and Cell Counting Equipment

Abstract

Silicon chip and cell counting equipment based on machine vision belongs to the field of machine vision counting technology. The equipment includes a detection case, a computer screen and a computer case. Body, camera, lens, coaxial light source, ring light source, bracket and light source controller set inside the box, and detection buttons, slide rails, pressure plates, detection ports, detection table, pedal switch set outside the box, the pedal The switch is connected to the detection box; the detection button is fixedly set on the top of the box, the slide rail is set on one side of the box and extends to the top of the box, and the side of the box where the slide rail is set is also equipped with a matching pressure plate. detection port. The equipment is not only small in size, but also improves the counting accuracy and system applicability, prevents the platen from being polluted and damages the silicon wafer, and the test start is convenient and fast. At the same time, the device is simple in structure, easy to maintain and maintain, and has good practicability.

Description

technical field [0001] The invention belongs to the technical field of machine vision counting, and in particular relates to a machine vision-based silicon wafer and cell counting device. Background technique [0002] In the production process of solar cells, silicon chips or cells need to be counted after the incoming inspection of raw silicon chips, the factory acceptance of finished cells, and each process in the cell processing process. At present, the widely used counting method is manual visual inspection, which is completed by manual counting in a short period of time, which increases labor costs and is prone to improper operation or counting errors; and the thickness of solar silicon wafers or cells is relatively thin, generally About 180 microns and the silicon wafer or battery is fragile and afraid of pollution. Manual counting cannot meet the above requirements. [0003] With the development of machine vision technology, in the prior art, there is a method of obt...

AI Technical Summary

Problems solved by technology

At present, the widely used counting method is manual visual inspection, which is completed by manual counting in a short period of time, which increases labor costs and is prone to improper operation or counting errors; and the thickness of solar silicon wafers or cells is relatively thin, generally About 180 microns and the silicon wafer or battery is fragile and afraid of pollution, manual counting cannot meet the above requirements

[0003] With the development of machine vision technology, in the prior art, there is a method of obtaining images through imaging devices to complete counting. This method integrates the computer case and screen with the test case, which makes the test case bulky, and when the case fan is hot, the fan does not work. Vibration will affect the image acquisition quality of the imaging device. In addition, the imaging device does not use a light source, and the image quality of the cells captured inside the chassis is not ideal, thus affecting the counting accuracy. The above improvements cannot meet production needs in actual operation.

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