A non-destructive dynamic monitoring device and method for corn leaf area

Abstract

The invention discloses a non-destructive dynamic monitoring system and method for corn leaf area. The invention adopts a method of combining multi-dimensional positioning image acquisition and image analysis. The equipment is light and easy to operate, and it can quickly and conveniently collect multi-dimensional corn leaf area in the field. Image; after comprehensive image processing in the later stage, each processing can output parameters such as three-dimensional leaf posture, plant height, green leaf area, and withered yellow leaf area of ​​three corn plants; it can record the corresponding position information, and can ensure that the measurement object is the same sample for multiple times, and With multiple correction and quality control functions, it can realize long-term dynamic monitoring of corn leaf area; the image acquisition module and image processing module are separated, and the information is transmitted wirelessly, which is convenient for field operations; it provides dynamic and comprehensive monitoring and management of corn growth. information.

Description

technical field [0001] The invention relates to the technical field of intelligent agriculture, in particular to a nondestructive dynamic monitoring device and method for corn leaf area. Background technique [0002] Leaf area is an important indicator to measure the growth and production capacity of crops. Maize is an important food crop, and the measurement of maize leaf area has always been one of the important tasks of agricultural researchers. The traditional measurement method of measuring the length and width of each leaf separately and estimating with empirical formulas is time-consuming and laborious, with low accuracy, and it is easy to cause damage to the leaves of corn, thereby affecting the photosynthetic capacity. Some leaf area meters scan the leaf images one by one to calculate the leaf area, which improves the collection accuracy to a certain extent, but there are as many as 30 leaves in corn, and the height of the leaves can reach up to 3 meters, and the b...

AI Technical Summary

Problems solved by technology

Patent CN201410229812.3 discloses a method and system for measuring leaf area index, which realizes the accuracy of measurement, but requires destructive sampling, and the leaves must be picked from the plant for scanning, and the collected data are not comparable, and It is difficult to realize the dynamic monitoring of leaf area

Patent CN201010231726.8 discloses a method of measuring rice leaf area index by hemispherical photography, but it is difficult to efficiently apply it to the measurement of corn leaf area with tall plants, and this method converts the image into a binary grayscale image, which cannot identify the Withered and yellow leaf area, it is difficult to apply in the middle and late stages of growth

Patent CN201320029088.0 discloses a system for measuring the leaf area of ​​crops. The image of each leaf is collected with a four-corner bracket and a whiteboard. (about 5000 plants per mu), this method has poor adaptability when collecting corn leaf area, and is easily blocked during operation and causes physical damage to the plants

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