Method for manufacturing zinc-doped ultra shallow junction on surface of semiconductor substrate
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- INST OF MICROELECTRONICS CHINESE ACAD OF SCI
- Publication Date
- 2015-06-24
- Estimated Expiration
- Not applicable Β· inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for preparing an ultra-shallow junction of a semiconductor substrate, in particular to a method for preparing a zinc-doped ultra-shallow junction on the surface of a semiconductor substrate, and belongs to the technical field of semiconductor integration. Background technique
[0002] As the core and foundation of the information industry, semiconductor technology is an important symbol to measure a country's scientific and technological progress and comprehensive national strength. In the past 40 years, CMOS integration technology has followed Moore's law to increase the working speed of devices, increase integration and reduce costs by reducing the feature size of devices. However, when the gate length of MOS devices is reduced to less than 90 nanometers, especially when entering the node of 65 nanometers and below, the source / drain region and the source / drain extension region are required to be correspondingly shall...