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Flip LED chip and manufacturing method thereof

A technology of LED chip and manufacturing method, which is applied in the direction of electrical components, electric solid devices, circuits, etc., and can solve the problems that the reflectivity of mirrors is lower than 90%, restricts the quality of flip-chip LED chips, and has limitations in light absorption and reflectivity. , to achieve the effects of improving light extraction efficiency, photoelectric conversion efficiency, and average reflectance

Inactive Publication Date: 2015-06-24
ENRAYTEK OPTOELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the light-emitting layer added between the PN junction and the P electrode of the flip-chip LED chip is a metal structure, which relies on the high reflectivity of Ag, Al, Rh and other metals to complete the reflection of the light emitted by the quantum well layer to the bottom of the chip. Metal reflection There are many disadvantages: there are different degrees of light absorption for each light incident angle, and there are limits to reflectivity, such as mirror reflectivity below 90%
Therefore, it still restricts the quality of flip-chip LED chips

Method used

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  • Flip LED chip and manufacturing method thereof

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Embodiment Construction

[0030] The flip-chip LED chip of the present invention and its manufacturing method will be described in more detail below in conjunction with schematic diagrams, wherein a preferred embodiment of the present invention is shown, and it should be understood that those skilled in the art can modify the present invention described here and still implement the present invention. Beneficial effects of the invention. Therefore, the following description should be understood as the broad knowledge of those skilled in the art, but not as a limitation of the present invention.

[0031] In the interest of clarity, not all features of an actual implementation are described. In the following description, well-known functions and constructions are not described in detail since they would obscure the invention with unnecessary detail. It should be appreciated that in the development of any actual embodiment, numerous implementation details must be worked out to achieve the developer's spec...

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Abstract

The invention discloses a flip LED chip and a manufacturing method of the flip LED chip. The flip LED chip comprises a front-end structure with a substrate, an N-type gallium nitride layer, a quantum well layer and a P-type gallium nitride layer, and the N-type gallium nitride layer, the quantum well layer and the P-type gallium nitride layer are formed on the substrate. An Ohmic contact layer, a mirror medium layer and a mirror metal layer are formed on the front-end structure, and a first electrode connected with the N-type gallium nitride layer and a second electrode connected with the mirror metal layer are formed. In the flip LED chip, incoming light outside the full reflecting angle of gallium nitride and the mirror medium layer can be fully reflected, the absorption proportion of a mirror on light is reduced, meanwhile, the average reflecting rate of the full incident angle of the mirror is improved, the light emitting efficiency of the chip is improved, and the photoelectric conversion efficiency of the LED chip is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a flip-chip LED chip and a manufacturing method thereof. Background technique [0002] For traditional front-mounted LED chips, P-type GaN is difficult to dope, resulting in low hole carrier concentration and difficulty in growing thick, resulting in difficult diffusion of current. At present, the method of preparing ultra-thin metal film or ITO film on the surface of P-type GaN is generally used to achieve The current has to spread evenly. However, the metal thin film electrode layer has to absorb part of the light to reduce the light extraction efficiency, and if the thickness is reduced, it will in turn limit the current diffusion layer to achieve uniform and reliable current diffusion on the surface of the P-type GaN layer. Although the light transmittance of ITO is as high as 90%, the electrical conductivity is not as good as that of metal, and the diffusion effect o...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/00H01L33/60
CPCH01L2224/14
Inventor 李智勇徐慧文李起鸣张宇
Owner ENRAYTEK OPTOELECTRONICS
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