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A high-sensitivity phase noise measurement method and device

A phase noise, high-sensitivity technology, applied in the direction of noise figure or signal-to-noise ratio measurement, etc., can solve the problems affecting the phase noise measurement sensitivity, reduce the phase noise measurement sensitivity, and require extremely high phase noise indicators, and achieve excellent phase noise measurement sensitivity. , The effect of high phase noise measurement sensitivity and high technical threshold requirements

Active Publication Date: 2018-03-20
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] 1. Using the phase detection method to measure phase noise requires a reference local oscillator inside the system, and the phase noise measurement sensitivity of the system largely depends on the index of the reference local oscillator; in order to achieve higher phase noise measurement sensitivity, the reference local oscillator phase The requirement of noise index is extremely high, which also determines that the scheme is not only complex in composition, but also expensive in implementation
[0007] 2. The implementation process of using the phase detection method to measure phase noise is also relatively complicated. It is necessary to measure the phase detection constant in advance each time (the frequency difference between the local oscillator and the measured source is about 1MHz, and measure the amplitude of the difference frequency signal), and then measure the phase noise after phase detection. Noise voltage, and finally the test results are given after data processing; in order to ensure the stability of the loop during the measurement, it is necessary to reserve a period of phase-locking time, so the entire measurement time is also longer
[0008] 3. The quantized dynamic range of phase noise is determined by the number of AD conversion bits. At present, the conversion number of high-speed ADCs is up to 14 or 16 bits, and the relative resolution of the corresponding phase is less than 1 / 100000; spurious and low phase noise measurements cannot be taken into account. Moreover, stray noise will affect the phase noise measurement sensitivity. In order to ensure accurate measurement, the gain of the controllable gain unit will not be too large when there are stray noises, which will reduce the phase noise measurement sensitivity of the system.

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Embodiment 1

[0031] Such as figure 2 As shown, it is Embodiment 1 of the present invention, a flow chart of a high-sensitivity phase noise measurement method, as shown in the figure, including:

[0032] Step 201, performing precise power measurement on the signal under test to obtain the precise power value of the signal under test;

[0033] Step 202, performing continuous frequency measurement on the measured signal at equal intervals to obtain continuous frequency measurement values;

[0034] Step 203 , according to the precise power value of the signal under test and the continuous frequency measurement value, calculate and obtain the power spectral density of the single sideband.

[0035] Wherein, the precise power measurement of the measured signal to obtain the precise carrier power value of the measured signal specifically includes:

[0036] performing effective value detection on the measured signal;

[0037] The detection signal is filtered by a low-pass filter to remove carri...

Embodiment 2

[0058] Such as image 3 As shown, it is a structural diagram of a high-sensitivity phase noise measurement device in Embodiment 2 of the present invention, including:

[0059] A power measurement unit 301, configured to perform precise power measurement on the signal under test to obtain an accurate power value of the signal under test;

[0060] A continuous frequency measurement unit 302, configured to perform continuous frequency measurements at equal intervals on the measured signal to obtain continuous frequency measurement values;

[0061] The data processing unit 303 is configured to calculate the single sideband power spectral density according to the precise power value of the signal under test and the continuous frequency measurement value.

[0062] Figure 4 Implement block diagrams for power measurement units such as Figure 4 As shown, the power measurement unit 301 includes:

[0063] A detection subunit 401, configured to perform effective value detection on t...

Embodiment 3

[0086] This embodiment provides a method for measuring phase noise, and further explains the present invention in combination with specific experimental data.

[0087] Step 1: Use ADC to sample the detection voltage of the signal under test, and calculate the precise power value of the signal under test through formula 1, where V 0 Indicates the detection bias when no signal is added, R indicates the input impedance, and its default value is 50 ohms, P 0 It is a calibration constant that needs to be calibrated, which is related to the gain of the logarithmic amplifier and the detection coefficient. After being corrected by this calibration constant, Pc is consistent with the precise power value of the measured signal. For the specific implementation of the power measurement unit, see Figure 4 shown.

[0088] P c =10×log[(V-V 0 ) 2 / R]-P 0 (1)

[0089] Step 2: Perform continuous frequency measurement on the measured signal at equal intervals according to the analysis f...

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Abstract

The invention relates to the technical field of testing, and discloses a high-sensitivity phase noise measurement method and device; the precise power value of the measured signal is obtained by performing precise power measurement on the measured signal; Measure to obtain continuous frequency measurement values; according to the precise power value of the measured signal and the continuous frequency measurement values, calculate the single-sideband power spectral density; the present invention can meet the requirements of high-performance oscillators and frequency synthesizers. Phase noise testing requirements.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a high-sensitivity phase noise measurement method and device. Background technique [0002] Phase noise is an important index to measure the short-term stability of the frequency source. The phase noise index of the frequency source in the electronic system has an important impact on the performance of the equipment. For example, the phase noise of the local oscillator in the radar T / R component will affect the detection range of the radar target. The phase noise of the local oscillator of the machine will affect the measurement sensitivity of the receiver, and the phase noise of the carrier signal in the communication system will affect the bit error rate and so on. In order to improve the performance of the electronic system, the phase noise index of the frequency source is getting lower and lower, especially for some high-performance high-stable crystal oscillators, the phase ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/26
Inventor 朱伟杜念文李伟毛黎明
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP