Fully new LED (Light Emitting Diode) crystal grain detection technology

Abstract

The invention discloses a detection method, and aims to provide a crystal grain detection technology which is low in production cost and can greatly shorten the measurement time of a chip. According to a fully new LED (Light Emitting Diode) crystal grain detection technology, a performance test probe is additionally arranged on a table; firstly the electrostatic discharge capacity of the chip is measured by using an ESD (Electronic Static Discharge) unit probe; the chip after the antistatic property measurement moves; in a movement process of the chip, the movement of the chip is controlled through a servo driver; the chip is placed just below an SMU (Source Measure Unit) unit probe to guarantee that the detection position of the SMU unit probe is the same as the detection position of the ESD unit probe and measure and record the electric property of the chip; when the electric property of the chip is measured by the SMU unit probe, all data of the same chip is comprehensively recorded at the same time, so the measurement time of the chip is shortened, the production cost can be greatly reduced, the positions in two measurement processes are positioned at the same position of the chip, and extra damage is not caused to the appearance of the chip.

Description

technical field [0001] The invention is a detection method, and in particular relates to a brand-new LED crystal grain detection technology. Background technique [0002] In the process of testing the chip, the LED chip testing machine currently used first tests the antistatic ability of the chip, then measures the various electrical properties of the chip, and finally records all the measurement data of the chip; if the chip If the antistatic ability of the chip is not enough, give up measuring the electrical properties of the chip. The disadvantage of this method is that the test time of a single chip is long and the efficiency is low. If mass production is to be satisfied, there is a large demand for personnel and machines, resulting in extremely high machine costs and personnel costs. Contents of the invention [0003] The invention overcomes the shortcomings of the prior art and aims to provide a crystal grain inspection technology with low production cost and great...

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that the test time of a single chip is long and the efficiency is low

If it is necessary to meet mass production, the demand for personnel and machines is large, resulting in extremely high machine costs and personnel costs.