19 results about "Source–measurement unit" patented technology

The invention discloses an integrated circuit source measurement unit control method for improving a raccoon algorithm and optimizing fuzzy PID. The method comprises the steps that an output voltage control system of an SMU is set up; acquiring output end voltage data of the SMU system in real time; calculating a voltage error and a voltage error change rate; a fuzzy inference rule base is constructed, fuzzy controller parameters are dynamically adjusted based on the fuzzy rule base according to the voltage deviation value and the voltage error change rate, and then PID parameters are dynamically adjusted; a control signal is generated according to the set PID parameter, and the output voltage of the SMU is adjusted; and S4, optimizing the fuzzy PID voltage controller obtained in the step S4 by adopting an improved raccoon algorithm, selecting a decision variable as a parameter of a fuzzy controller, and assigning the optimized parameter to the fuzzy PID voltage controller to realize control on the output voltage of the SMU. According to the invention, the improved raccoon optimization algorithm and the fuzzy PID controller are combined and applied to the integrated circuit source measurement unit, so that the control performance of the SMU system is improved.

The techniques and circuits, described herein, include solutions for error compensation in source measurement units (SMUs). An example SMU is capable of both sourcing current to a device under test (DUT) and measuring current through the DUT. An SMU may include a sensing resistor coupled in series with the DUT. A voltage across the sensing resistor may be measured by a current sensing amplifier in order to determine the output current through the DUT. In practice, the resistance of the sensing resistor may vary depending on manufacturing tolerances, etc. A gain of the current sensing amplifier may be calibrated in order to compensate for sensing resistor variance, which increases the accuracy with which current to the DUT can be sourced and measured.

The invention provides a circuit for improving small current measurement speed, a measurement method and a system, which can be applied to the current measurement requirement of a pA-level range, a first resistor and a first capacitor form a first RC charging and discharging loop, and when small current flows through the first resistor, after the first capacitor is charged, the first resistor is connected with the first RC charging and discharging loop; the output end of the first operational amplifier outputs steady-state measurement voltage, the second resistor and the second capacitor form a second RC charging and discharging loop, and in the charging process of the first capacitor, the second capacitor is controlled to discharge for auxiliary energy charging of the first capacitor. In the invention, the first resistor with a large resistance value is selected to realize indirect measurement of the small current, and meanwhile, the charging speed of the first capacitor is improved through additional RC charging and discharging loop arrangement, so that the single current measurement speed of the source measurement unit in the small current test operation is improved.

The invention relates to the technical field of battery cells, in particular to a portable battery cell self-discharge rapid test system, which is used for screening batched battery cells, and comprises a test circuit of which the first end and the second end are used for being detachably connected with a to-be-tested battery cell; the high-precision source measurement unit is integrated in the test circuit and is used for applying micro-current pulse excitation to the to-be-tested battery cell and monitoring the voltage response of the to-be-tested battery cell; and the controller is electrically connected with the high-precision source measurement unit and is configured to control the high-precision source measurement unit to execute test operation, obtain multi-dimensional characteristic parameters of the to-be-tested battery cell, input the multi-dimensional characteristic parameters into a batch statistics-based normalized scoring model constructed in advance, obtain a quality score of the to-be-tested battery cell, and obtain the quality score of the to-be-tested battery cell. And classifying and screening the to-be-detected battery cells according to the quality scores of the to-be-detected battery cells in combination with the dynamic threshold values of the battery cells to obtain a final evaluation result of the to-be-detected battery cells. The technical problems that in the prior art, measurement is long in time consumption and prone to being affected by external environment factors are solved.

The invention relates to a self-adaptive dynamic performance optimization method and system for a source measurement unit, and the method specifically comprises the following steps: Step 1: signal collection and performance index extraction: controlling the source measurement unit to output a step signal, and collecting and outputting response waveform data; calculating rise time, stable time and overshoot of the current output waveform according to the output response waveform data; step 2, intelligent parameter recommendation: inputting the rise time, the stabilization time and the overshoot obtained in the step 1 into a pre-constructed intelligent recommendation algorithm model in real time to obtain an adjusted PID control parameter; 3, parameter boundary constraint and safety protection are carried out; step 4, updating the parameters of the controller and carrying out online iteration; according to the invention, multi-dimensional intelligent balance and optimization of dynamic performance are realized; and the method has high adaptivity and intelligent level.

The invention relates to a data format conversion method and device, electronic equipment and a storage medium. The method comprises the steps of obtaining meta information of a source data file; wherein the meta information comprises a sensitivity coefficient corresponding to each channel and a source measurement unit corresponding to each channel, and one channel corresponds to one physical quantity; reading a source signal value acquired for the physical quantity corresponding to each channel from a data segment of the source data file; according to the sensitivity coefficient corresponding to each channel and the corresponding source measurement unit, performing format conversion on the corresponding source signal value to a target data format to obtain a target signal value of the corresponding source signal value in the target data format; according to the scheme, the source data file is automatically converted into the target data format.

The invention discloses an automatic test equipment calibration method and system, electronic equipment and a medium, and belongs to the technical field of detection. A source measurement unit of the automatic test equipment comprises a PID module, the output end of the PID module is provided with a gain module, and the method comprises the following steps: measuring a transient electrical signal output by the source measurement unit; when the transient electrical signal overshoots relative to the reference electrical value and the overshoot percentage is higher than a first threshold value, or when the transient electrical signal undershoots relative to the reference electrical value and the undershoot percentage is lower than a second threshold value, the gain coefficient of the gain module is adjusted, the overshoot percentage is not higher than the first threshold value and the undershoot percentage is not lower than the second threshold value. In the automatic test equipment calibration process, the transient electrical signal output by the PID module is optimized by adjusting the gain coefficient of the gain module, fine calibration is achieved, core PID parameters do not need to be directly reconfigured, and the calibration flexibility is improved.

The utility model provides a field effect transistor circuit comprising a field effect transistor to be detected, which comprises a grid electrode to be detected, a source electrode to be detected and a leak electrode to be detected; each connecting field effect transistor comprises a connecting grid electrode, a connecting source electrode and a connecting drain electrode; wherein the to-be-detected drain electrode is electrically connected with the plurality of connecting drain electrodes to form a drain electrode current measuring end; the plurality of connecting grids are electrically connected with the plurality of connecting sources, the plurality of connecting grids, the to-be-measured grid and the to-be-measured source form an input end of set voltage, and when the plurality of connecting field-effect transistors are in a turn-off state and the to-be-measured field-effect transistors are in different states, the drain current of the to-be-measured field-effect transistors is measured at the measuring end. According to the utility model, a high-precision source measurement unit is not needed, and the measurement precision of the turn-off current of the field effect transistor can be improved under the condition of low cost.

The invention discloses a dynamic scheduling automatic test system and a control method thereof. The method comprises the following steps: inputting a control parameter sequence; a voltage source, a source measurement unit and a current source are controlled according to the control parameter sequence, the voltage source applies grid voltage to a sample, under the current grid voltage, the system applies bias current to the sample through the source measurement unit and measures Hall voltage of the sample, and meanwhile, the current source applies circulating current according to a set step length; the driving electromagnet generates a scanning magnetic field; and the user side constructs a hysteresis loop according to the data points of the plurality of Hall voltages, and saves a control parameter sequence and a test result. The invention provides a complete, efficient and accurate automatic experiment solution aiming at VCMA and AHE measurement, so that the user operation is obviously simplified, the test efficiency is improved, and the data management is optimized.

The invention provides an integral summation type high-precision source measurement system and method, the source measurement system adopts discrete devices to build a power amplification module, the output can reach 100V and 1A, and the test requirements of high-power devices are met. A traditional source measurement system is poor in stability, a source measurement unit adopts a summation and integration structure, when a load suddenly changes, the system can be rapidly adjusted to a safe voltage / current value through a clamping circuit, an output value and a set value are kept consistent, the system stability is improved, the source measurement unit adopts a PXI 3U structure and can be inserted into a PXI case, and the system stability is improved. And a test system can be conveniently formed with other board cards. According to the technical scheme, the technical problems that in the prior art, a source measuring unit is not wide enough in output range, poor in system stability, large in size, poor in portability and not suitable for system integration are solved.

The invention relates to the technical field of semiconductors, and discloses a semiconductor material testing device and method, and the device comprises a parameter analyzer, the lower part of the parameter analyzer is provided with a connection assembly, and the right side of the parameter analyzer is provided with a protection storage assembly. The handles at the two ends of the integrated socket in the connecting assembly are pushed into the positioning grooves, so that the integrated socket forms a stable locking state. The test method comprises the following steps: controlling a source measurement unit to inject calibration current into a test loop by using a physical boundary condition with a stable locking state solidified; the static characteristic de-embedding processing module is used for establishing a static linear impedance mathematical model and extracting a static contact impedance constant and a static bias voltage, and in a formal test, the system performs de-embedding compensation calculation on an original response voltage by using the static contact impedance constant and the static bias voltage. The real electrical response voltage of the semiconductor material is restored, and the comprehensive protection performance of the testing device is improved.

The utility model discloses an IGBT gate drive chip test system, comprising an IGBT gate drive chip test industrial personal computer which is electrically connected with an IGBT gate drive chip to be tested through an electric channel conversion box; the IGBT gate drive chip test industrial personal computer comprises a plurality of source measurement units, and the source measurement units, the signal control unit and the data processing unit are interconnected through a bus; the source measurement unit comprises a processor, and the processor is electrically connected with a current-increasing voltage-measuring FIMV module and a voltage-increasing current-measuring FVMI module through a DAC module and an ADC module. The IGBT gate drive chip test system disclosed by the utility model can output high voltage and drive large current, and is fast in test speed.

The application relates to the technical field of battery cells, in particular to a portable battery cell self-discharge rapid test system, which is used for screening a batch of battery cells and comprises a test circuit, a first end and a second end of the test circuit are used for detachably connecting a battery cell to be tested, a high-precision source measurement unit is integrated in the test circuit and is used for applying a micro-current pulse excitation to the battery cell to be tested and monitoring a voltage response thereof, a controller is electrically connected with the high-precision source measurement unit and is configured to control the high-precision source measurement unit to perform a test operation, acquire multi-dimensional characteristic parameters of the battery cell to be tested, input the multi-dimensional characteristic parameters into a normalization scoring model based on batch statistics which is constructed in advance, acquire a quality score of the battery cell to be tested, and perform a grading screening on the battery cell to be tested according to the quality score of the battery cell to be tested in combination with a dynamic threshold of the battery cell, and finally acquire an evaluation result of the battery cell to be tested. The application solves the technical problems that the prior art is time-consuming and is easily affected by external environmental factors.

The invention relates to a three-terminal laminated solar cell test method, which comprises the following steps of: respectively arranging a source measurement unit (SMU) between a common electrode and a bottom electrode and between a top electrode and the common electrode of a three-terminal laminated solar cell to be tested, applying voltage at the same time, and then detecting passing steady-state current; and after the electrical performance parameter and the maximum power working point (MPP) are obtained, the voltage setting range is further narrowed, and the test is repeated to obtain an accurate value of the maximum power working point. The method can be suitable for a series structure and a reverse series structure at the same time.

The invention discloses a source measurement unit control method for improving a spider bee algorithm to guide reinforcement learning and optimize PID. The method comprises the following steps: setting initial parameters; calculating a system transfer function according to an actual SMU model, and building a simulation control model of the SMU system based on an MATLAB platform; an SWO algorithm is improved through multiple strategies, and an MISWO module is formed; the DDPG deep strengthening model is improved, and an IDDPG model is formed; the MISWO module and the IDDPG model are fused, an evolutionary reinforcement learning framework (ERL) is constructed, and online guidance of the MISWO algorithm on the IDDPG is formed; and the ERL is applied to the SMU system to realize PID control of the SMU. The SWO and the DDPG are improved in a targeted mode, the PID control performance is improved, the ERL structure algorithm can use a group search mechanism to make up for the limitation of a strategy gradient algorithm on global search, and therefore the control performance and robustness of an SMU system are improved.

The present application relates to the technical field of power supply system core device health management, and discloses a method for 1 / f noise test by using a source table, comprising: performing short-time pre-detection in a thermal equilibrium stage to obtain a first-order drift rate of current; constructing a thermal drift linear prediction model to calculate a limit current envelope of a whole test period; locking an optimal static range with the highest resolution and meeting the upper limit of the range in a source measurement unit according to the limit current envelope; and continuously collecting time-domain fluctuation data under the fixed range and mapping the time-domain fluctuation data into a noise spectrum, wherein the present application effectively solves the contradiction between range overflow and insufficient quantization accuracy caused by thermal drift in long-period test through a prior range arbitration mechanism based on the drift envelope, eliminates transient interference introduced by dynamic range switching, and realizes nondestructive characterization of early defects of the device oxide layer.

The application provides a capacitor test circuit and a test method thereof. The test circuit comprises a charging voltage generating circuit, a QVCM test circuit and a capacitor to be tested. The charging voltage generating circuit comprises a first transmission gate, a second transmission gate, a first source measurement unit and a second source measurement unit. The input ends of the first transmission gate and the second transmission gate are connected to the first source measurement unit and the second source measurement unit respectively. The output ends of the first transmission gate and the second transmission gate are connected to a first node. The QVCM test circuit comprises a third transmission gate, a fourth transmission gate, a third source measurement unit and a fourth source measurement unit. The output ends of the third transmission gate and the fourth transmission gate are connected to the third source measurement unit and the fourth source measurement unit respectively. The input ends of the third transmission gate and the fourth transmission gate are connected to a second node. The gate G end of the capacitor to be tested is connected to the second node, and the substrate B end, the source S end and the drain D end of the capacitor to be tested are connected to the first node.

The application discloses a testing method for a three-terminal tandem solar cell. The method comprises the following steps: setting a source measurement unit (SMU) between a common electrode and a bottom electrode of a three-terminal tandem solar cell to be tested, setting another SMU between a top electrode and the common electrode, and simultaneously applying a voltage to detect a steady-state current passing through the two SMUs; obtaining an electrical performance parameter and a maximum power point (MPP); further narrowing a voltage setting range and repeating the test to obtain an accurate value of the MPP. The application can be simultaneously applied to a series structure and a reverse series structure.

The application provides a high-density test chip super-speed measurement method, preset signals required for testing are written into a function generator and a source measurement unit; the function generator and the source measurement unit are controlled to generate synchronous trigger CLK signals and DF signals respectively, an address register connected with the function generator switches addresses according to waveform transformation of the CLK signals, the source measurement unit continuously samples different addresses according to the DF signal frequency, a plurality of sampling data corresponding to each address is determined, and effective measurement values corresponding to each signal address of the function generator are determined from the plurality of sampling data and are aligned. The super-speed test is realized by means of hardware synchronous triggering and cooperation of the SMU continuous sampling mode, each address is measured multiple times, data analysis is cooperated to realize alignment of the test address and the effective data, the test data misplacement problem can be avoided, and the test data stability is effectively improved. A test system with corresponding advantages is also provided.