Flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and method thereof

A flat sample, space charge technology, applied in measurement devices, measurement of electrical variables, measurement of dielectric strength, etc. Noise ratio, prevention of environmental electromagnetic interference, effect of prevention of electromagnetic interference

Active Publication Date: 2015-08-12
NANJING NARI GROUP CORP +3
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The space charge measurement of flat sample based on the pressure wave method, the space charge distribution signal is easily disturbed, and the signal attenuation is relatively large, especially the high-voltage lead wire and coaxial cable are easy to introduce external electromagnetic interference, resulting in a low signal-to-noise ratio of the measurement system and inaccurate measurement

Method used

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  • Flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and method thereof
  • Flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and method thereof
  • Flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and method thereof

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Embodiment Construction

[0044] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.

[0045] Such as figure 1 As shown, a device for measuring the space charge distribution of a flat sample to prevent electromagnetic interference includes a high-voltage DC power supply 1, a high-voltage lead wire 2, an insulating self-adhesive tape 3, a high-voltage resistor 4, a first waveguide 5, a signal shielding box 6, a limiter Current resistance 7, DC blocking capacitor 8, coaxial cable 9, second waveguide 10, sample shielding box 11, metal support 22, electrode measurement unit 100, amplifier 20, digital oscilloscope 21, high temperature drying oven 24, laser 25.

[0046] The current limiting resistor 7 and the DC blocking capacitor 8 are arranged in the signal shielding box 6 .

[0047] The electrode measurement unit 100 is arranged in the sample shielding box 11, and the sample shielding box 11 and the metal pillar 22 are ar...

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PUM

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Abstract

The invention discloses a flat sample space charge distribution measuring apparatus capable of preventing electromagnetic interference and a method thereof. The measuring apparatus comprises a high-voltage DC power source (1), a high-voltage lead (2), an insulation self-adhesive tape (3), a high-voltage resistor (4), a first waveguide tube (5), a signal shielding case (6), a current-limiting resistor (7), a blocking capacitor (8), a coaxial cable (9), a second waveguide tube (10), a sample shielding case (11), a metal pillar (22), an electrode measuring unit (100), an amplifier (20), a digital oscilloscope (21), a high temperature drying box (24) and a laser (25). According to the invention, the high-voltage lead is led to the signal shielding case through the first waveguide tube, and the signal shielding case is connected to the sample drying box through the second waveguide tube, so that electromagnetic interference by external environment can be effectively prevented; and the middle portion of the high-voltage lead is connected to the high-voltage resistor, so that the electromagnetic interference in the environment can be coupled to a circuit, and the environment electromagnetic interference can be effectively prevented.

Description

technical field [0001] The invention relates to the field of space charge distribution measurement, in particular to a flat sample space charge distribution measurement device and method for preventing electromagnetic interference. Background technique [0002] Electrically insulating materials result in the formation of internal defects due to defects in their molecular structure. Under the action of the electric field, the carriers move along the direction of the electric field. When these carriers encounter the formed defects, they will be trapped by them, forming corresponding space charges. The Coulomb field and the applied electric field formed by these space charges will change the distribution of the original electric field, resulting in serious distortion of the electric field in the material, which will cause the development of the electric tree and lead to the destruction of the insulation. Therefore, space charge seriously affects the performance of electrical i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/24G01R31/12
Inventor 郭世忠杨黎明朱智恩李栋高凯曾浩
Owner NANJING NARI GROUP CORP
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