Jitter tolerance testing method and circuit for high-speed serial IO interface based on BIST
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- PEKING UNIV
- Publication Date
- 2015-09-30
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention discloses a high-speed serial IO interface jitter tolerance test method and circuit, specifically implementing jitter injection and error code detection inside a receiver circuit of the high-speed serial interface to complete the receiver jitter tolerance test. Background technique
[0002] Input / output (I / O) has always played a key role in computer and industrial applications. In the early parallel I / O bus, the data alignment problem of the interface affects the effective communication with external devices. However, with the increase of processor speed, I / O has become the bottleneck of system-level performance, and improving I / O performance is very critical to improve system performance. In the current high-speed communication system, the serial communication technology SerDes (serializer / deserializer) originally used for optical fiber communication has become the key to the high-speed communication system due to its ability to comply ...