Low-dielectric-loss microwave electronic ceramic material

An electronic ceramic and low-dielectric technology, applied in the field of microwave dielectric ceramic material manufacturing, can solve the problems of high sintering temperature, difficult preparation, large temperature coefficient of resonance frequency, etc., and achieve the effect of improving frequency and temperature stability

Inactive Publication Date: 2015-11-11
成都顺康三森电子有限责任公司
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Although the existing Al 2 o 3 , MgAlO 4 Low dielectric constant dielectric ceramics, but there are disadvantages such as high sintering temperature, difficult preparation, and large temperature coefficient of resonance frequency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0010] The present invention will be further described below in conjunction with specific embodiment:

[0011] The low dielectric loss microwave electronic ceramic material of the present invention is made of aZnO.bSiO 2 .cTiO 2 .dCaCO 3 .eAl 2 o 3 A composition represented by a chemical formula, wherein a, b, c, d and e independently represent a molar ratio, and satisfy: 35mol%≤a≤45mol%, 30mol%≤b≤35mol%, 0mol%≤c≤10mol%, 10mol% %≤d≤20 mol%, 0 mol%≤e≤10 mol%, a+b+c+d+e=100 mol%.

[0012] Wherein, the composition of embodiment 1~5 ceramic material is as shown in table 1:

[0013] Example

ZnO

SiO 2

TiO 2

CaCO 3

Al 2 o 3

1

35

35

0

20

10

2

38

33

7

14

8

3

40

32

5

18

5

4

42

30

4

15

9

5

45

35

10

10

0

[0014] Table 1

[0015] The above-mentioned low dielectric loss microwave electronic ceramic materi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a low-dielectric-loss microwave electronic ceramic material of which the expression is aZnO. bSiO2.cTiO2.dCaCO3.eAl2O3, wherein a, b, c, d and e respectively independently represent molar rates; and 35mol%<=a<=45mol%, 30mol%<=b<=35mol%, 0mol%<=c<=10mol%, 10mol%<=d<=20mol%, 0mol%<=e<=10mol%, and a+b+c+d+e=100mol%. The dielectric constant of the low-dielectric-loss microwave electronic ceramic material is 7-10; the low-dielectric-loss microwave electronic ceramic material has low loss (Qf is greater than 100000 GHz) and approximately zero temperature coefficient of resonance frequency; and by using the low-dielectric-loss microwave electronic ceramic, the dielectric resonator, filter and other microwave components can be more suitable for application in higher frequency and higher power, thereby being beneficial to improvement of the frequency and temperature stability of the device.

Description

technical field [0001] The invention belongs to the technical field of microwave dielectric ceramic material manufacturing, and in particular relates to a microwave electronic ceramic material with low dielectric loss. Background technique [0002] Microwave electronic ceramics is a new type of functional ceramic material developed in recent decades. It can be used as a dielectric material in microwave frequency band (mainly 300MHz ~ 30GHz) circuits and complete one or more functions. Key materials for microwave components such as oscillators, oscillators, and phase shifters. In recent years, with the rapid development of modern communication technologies such as mobile communication, satellite communication, global satellite positioning system (GPS), bluetooth technology and wireless local area network (WLAN), microwave technology has also shifted to higher frequencies, that is, to wider available frequency bands. Millimeter wave and submillimeter wave direction developmen...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C04B35/453
Inventor 王永生胥阳春刘珍侯冬梅
Owner 成都顺康三森电子有限责任公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap