Test fixture of light-emitting element

A technology for light-emitting components and test fixtures, which is used in optical instrument testing, machine/structural component testing, and measuring devices. The effect of preventing damage and efficient testing process
CN105222990AActive Publication Date: 2016-01-06GUANGZHOU WONDFO BIOTECH

Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
GUANGZHOU WONDFO BIOTECH
Publication Date
2016-01-06

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention relates to a test fixture of a light-emitting element. The test fixture comprises a pedestal, a testing assembly and a limiting assembly. The limiting assembly is used for realizing contact between a to-be-tested light-emitting element and test probes, thereby guaranteeing good contact during testing; after test completion, the to-be-tested light-emitting element can be taken from the test fixture rapidly without damaging the to-be-tested light-emitting element, so that the to-be-tested light-emitting element can be used repeatedly and other experiments are not affected and thus the whole testing process can be realized efficiently, simply and conveniently. The corresponding test assembly also can be adjusted flexibly according to different welding plate types of to-be-tested light-emitting elements; and different limiting assemblies can be modified freely under the circumstances of giving priority to the testing efficiency or giving priority to testing accuracy, thereby meeting different testing requirements.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to the field of light-emitting element testing, in particular to a light-emitting element testing jig. Background technique

[0002] With the development of chips and packaging technology of light-emitting elements such as LEDs, the dot pitch between light-emitting elements is getting smaller and smaller, and the pixel density per unit area is getting higher and higher. Due to the small dot pitch of high-density LED displays, in order to ensure stable product performance and facilitate manufacturing, high-density LED displays usually use surface-mounted LED lamps. Surface-mounted LED lamps often need to use optical test fixtures to test optical parameters before mounting, such as testing light intensity, dominant wavelength, light intensity distribution curve, color temperature, color coordinates, etc., to confirm the quality of the corresponding batch. Whether the LED lamps meet the requirements for manufacturing LED display scr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More