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Device for detecting aspheric surface shape by splicing interference of deformable mirrors

A technology of interference detection and deformable mirror, which is applied in the field of optical detection, can solve the problems of large data processing volume, low detection efficiency, large mechanical error, etc., and achieve the effect of increasing splicing efficiency, reducing detection time, and improving efficiency and accuracy

Inactive Publication Date: 2018-10-16
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The purpose of the present invention is to propose a device for detecting aspheric surface shapes by splicing and interfering deformable mirrors, so as to solve the problems of low detection efficiency, large mechanical error, long detection time and large amount of data processing in the prior art

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  • Device for detecting aspheric surface shape by splicing interference of deformable mirrors
  • Device for detecting aspheric surface shape by splicing interference of deformable mirrors
  • Device for detecting aspheric surface shape by splicing interference of deformable mirrors

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Embodiment Construction

[0057] Embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0058] The device of the present invention adopting splicing interference detection of deformable mirrors to detect aspheric surface shape comprises a deformable mirror compensation system, an interference detection system, a mechanical adjustment mechanism and a computer data processing module;

[0059] The computer data processing module includes a deformable mirror control unit 12, a multi-dimensional adjustment table control unit 13, an interferogram acquisition processing unit 14, a backhaul error correction unit and a sub-aperture splicing algorithm unit;

[0060] The aspherical surface 8 to be detected is fixed on the mechanical adjustment mechanism, and the interference detection system compensates the optical path difference with the reflected light from the aspheric surface 8 to be detected through a deformation mirror compensation system. The i...

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Abstract

The device for splicing and interfering detecting aspheric surface shapes using deformable mirrors belongs to the technical field of optical detection. The present invention includes an interference detection system, a deforming mirror compensation system, a mechanical adjustment mechanism and a computer data processing module; specifically, it includes the following steps: Step 1: Build an application Stitching interference detection device for deformable mirrors; Step 2: Divide the sub-aperture; Step 3: Move to the position of the sub-aperture to be detected, and adjust the surface shape or refractive index of the deformable mirror according to the modeling and interference fringes; Step 4: Acquisition and processing of the sub-aperture interferogram ; Step five, sub-aperture backhaul error correction; Step six, full-aperture surface splicing. The present invention combines the deformable mirror with the sub-aperture splicing interference detection method, which can effectively reduce the number of sub-apertures required to cover the full aperture, increase the effective area of ​​each sub-aperture and the overlapping area, and solve the problem of affecting the splicing accuracy due to the small overlapping area problem.

Description

technical field [0001] The invention belongs to the technical field of optical detection, and in particular relates to a device for detecting an aspheric surface shape by splicing and interfering deformable mirrors. Background technique [0002] Interference detection technology is a commonly used surface shape detection technology, which is the relative detection of the surface to be measured and the reference surface. The reference surfaces are generally flat or spherical, and there will not be more interference fringes when using them to test the polished plane and spherical surface, while using spherical reference surfaces to detect aspheric surfaces, when the slope of the aspheric surface is larger, the density of interference fringes is also higher. many. When the interference fringe density exceeds the Nyquist frequency of the interferometer detector, the interference fringe cannot be resolved by the detector, resulting in the aspheric surface being unable to be meas...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/24
Inventor 张敏武东城苗二龙隋永新杨怀江
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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