Method and system for non-contact comprehensive measurement of three-dimensional topography and slit size of large flat plate slit antenna

A crack antenna and comprehensive measurement technology, applied in optical testing flaws/defects, optics, instruments, etc., can solve the problems of low wind resolution, difficult to accurately target feature points, inability to measure, etc., to achieve high measurement accuracy and measurement site. Small workload, good effect of non-contact measurement

Active Publication Date: 2011-11-30
CHINA ELECTRONICS TECH GRP CORP NO 14 RES INST
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Problems solved by technology

Laser scanners can obtain massive point cloud data, especially suitable for 3D modeling of entities. The disadvantage is that it cannot me

Method used

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  • Method and system for non-contact comprehensive measurement of three-dimensional topography and slit size of large flat plate slit antenna
  • Method and system for non-contact comprehensive measurement of three-dimensional topography and slit size of large flat plate slit antenna
  • Method and system for non-contact comprehensive measurement of three-dimensional topography and slit size of large flat plate slit antenna

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Embodiment Construction

[0015] combine figure 2 , the non-contact method of the present invention comprehensively measures the three-dimensional topography and the size of the gap on the surface of a large-scale flat-panel crack antenna. During the process, a two-dimensional scanning movement is performed parallel to the radiating surface of the flat plate slit antenna 7, and its movement is controlled by the computer 5, and the control position accuracy reaches 0.01mm;

[0016] Secondly, the precision rangefinder 3 fixed on the two-dimensional motion guide rail 1 measures the vertical distance between the detection point and the surface of the tested flat panel crack antenna 7, and the distance cooperates with the position information of the precision rangefinder controlled by the computer 5 to complete the flat panel crack antenna. 7 The measurement of the three-dimensional coordinate value of the surface, the generation of the three-dimensional shape can be completed according to the three-dimens...

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Abstract

The invention relates to a non-contact method and system for comprehensively measuring the three-dimensional appearance and the size of the gap on the surface of a large flat-panel crack antenna. The precision rangefinder of the system measures the normal shape of the antenna, and coordinates with the coordinates of the two-dimensional moving guide rail to obtain an accurate three-dimensional shape map through computer processing. During the scanning process, the CCD completes the shooting of the partial image of the antenna. The computer system performs image stitching on the captured images, completes the calculation of the gap size, coordinates with the coordinate values ​​of the two-dimensional moving guide rail, and completes the measurement of the size of the radiation slot in the large flat-panel slot antenna and the measurement of their mutual positional relationship. On the basis of accurate size measurement, the defect area search is completed by comparing the design value. The invention can simultaneously measure the three-dimensional topography and flatness of the complex surface shape of the flat plate slit antenna, as well as surface features such as the geometric size of the radiation seam and the mutual positional relationship; it has the advantages of low cost, high measurement accuracy, non-contact measurement and good portability Features.

Description

a technical field [0001] The invention belongs to the non-contact measurement technology, in particular to a non-contact measurement method and system for comprehensively measuring the three-dimensional appearance and the size of the gap on the surface of a large flat plate crack antenna. Two background technology [0002] The large-scale planar slit antenna is the most widely used airborne radar antenna. This kind of antenna has very high requirements for design and processing precision. Among them, the surface topography of the antenna, the size of the radiation slit and the relative position relationship are the most critical factors in determining the telecommunication index of the antenna. . Therefore, the accurate measurement of the three-dimensional topography of the surface of the flat-panel slot antenna, the size of the radiation slot, and its relative position has very important guiding significance for controlling the quality of the antenna, researching and design...

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Application Information

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IPC IPC(8): G02B27/22G01N21/88
Inventor 平丽浩钱吉裕柳玉书
Owner CHINA ELECTRONICS TECH GRP CORP NO 14 RES INST
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