Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Embedding method for metallographic specimen

A metallographic sample and mounting technology, which is applied in the field of metallographic detection, can solve the problems of poor electrical conductivity, low mounting strength, and voids, etc., and achieves the effects of good production effect, high sample preparation efficiency, and reduced damage.

Active Publication Date: 2016-05-04
BEIJING CISRI GAONA TECH +1
View PDF6 Cites 19 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of the above analysis, the present invention aims to provide a method for mounting metallographic samples, which is used to solve the problems of low and brittle mounting strength of existing metallographic samples, easy to wear, and easy to generate gaps between the sample and the sample. Poor conductivity and other issues

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedding method for metallographic specimen
  • Embedding method for metallographic specimen
  • Embedding method for metallographic specimen

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0026] The technological process of the sample mounting method of the metallographic sample of the present invention is as follows:

[0027] Mold preparation: Al in mass percent 2 o 3 ≥99%, SiO 2 ≤0.2%, Fe 2 o 3 ≤0.1%, and the balance is caustic soda to prepare a mold crucible, and the mold size is 15mm×15mm×20mm.

[0028] Mounting the sample into the mold: place the sample to be mounted in the appropriate position of the mold.

[0029] Add appropriate amount of tin-lead scraps: Add appropriate amount of tin-lead scraps according to the size of the mold, and the mosaic material is tin-lead scraps with a tin content of 60-80wt%.

[0030] Heating: heat in a box-type resistance furnace for 0.5h, and the temperature in the resistance furnace is controlled at 300°C.

[0031] Curing at room temperature: take it out and cure it at room temperature for 0.5h, then the mount can be taken out.

[0032] Grinding and polishing: Use 120#, 320#, 800#, 1000#, 1500# sandpaper to grind t...

Embodiment 2

[0034] The technological process of the sample mounting method of the metallographic sample of the present invention is as follows:

[0035] Mold preparation: Al in mass percent 2 o 3 ≥99%, SiO 2 ≤0.2%, Fe 2 o 3 ≤0.1%, and the balance is caustic soda to prepare a mold crucible, and the mold size is Φ15mm×20mm.

[0036] Mounting the sample into the mold: place the sample to be mounted in the appropriate position of the mold.

[0037] Add appropriate amount of tin-lead scraps: Add appropriate amount of tin-lead scraps according to the size of the mold, and the mosaic material is tin-lead scraps with a tin content of 60-80wt%.

[0038] Heating: Put it into a box-type resistance furnace for heating for 5 hours, and the temperature in the resistance furnace is controlled at 500°C.

[0039] Curing at room temperature: take it out and cure it at room temperature for 2 hours, then you can take out the mount.

[0040] Grinding and polishing: Use 120#, 320#, 800#, 1000#, 1500# sa...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an embedding method for a metallographic specimen. The required device comprises a low-temperature chamber electric furnace and a mould; a mould crucible is prepared by taking the following components by weight percent: more than or equal to 99% of Al2O3, less than or equal to 0.2% of SiO2, less than or equal to 0.1% of Fe2O3 and the balance of alkali; the mould can be in various specifications, such as 15mm*15mm*20mm and phi 15mm*20mm; and tin and lead scraps containing 60-80wt% of tin are taken as embedding materials. The method comprises the following steps: putting a to-be-embedded specimen into the mould; adding a right amount of the tin and lead scraps according to the size of the mould; putting into an electric furnace at a preset temperature and then heating for 0.5-5h; taking out and solidifying for 0.5-2h at room temperature, thereby being capable of taking out the specimen; polishing the specimen step by step by using 120#, 320#, 800#, 1000# and 1500# abrasive paper, and then observing by the polished etched specimen. The specimen prepared according to the method provided by the invention can be applied to the observation for a metallographic microscope or a scanning electron microscope and EBSD (Electron Back-Scattered Diffraction) and EDS (Electronic Differential System) detection, and the data, such as a true and complete organization structure of the specimen, can be acquired.

Description

technical field [0001] The invention belongs to the technical field of metallographic detection, in particular to a method for mounting a metallographic sample. Background technique [0002] At present, most of the methods for inlaying metallographic samples of heat-resistant alloys such as high-temperature alloys include automatic inlay machines, dental tray powder, or clamping samples for sample preparation. Fixtures may become loose and slippery during the sample grinding and polishing process, which will affect the sample preparation effect; while using dental tray powder for inlaying, its main component is methyl methacrylate, which is low in strength and brittle, and the sample is easy to grind and polish. Wear and tear, and produce pores between the sample, which is not conducive to the smoothness and cleaning of the sample; at the same time, its interior is loose, porous and non-conductive, and the mounted sample cannot be directly used for scanning electron microsco...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28
CPCG01N1/28
Inventor 黄烁贺玉伟赵光普秦鹤勇胥国华
Owner BEIJING CISRI GAONA TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com