Multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking

A distance measuring device and multi-wavelength technology, which is applied in measuring devices, radio wave measuring systems, electromagnetic wave re-radiation, etc., can solve problems such as nonlinear error of measurement results, polarization aliasing of heterodyne interference signals, and leakage of polarization components , to achieve the effect of real-time measurement and expanding the non-ambiguous measurement range of distance measurement

Inactive Publication Date: 2016-05-18
NAT UNIV OF DEFENSE TECH
View PDF8 Cites 42 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The classic heterodyne interferometer is generally based on the optical path of the Michelson interferometer. The dual-frequency laser light source emits linearly polarized light with a fixed radio frequency difference and the polarization directions are perpendicular to each other. When the light source passes through the polarization beam splitter and enters the reference path and the measurement path respectively, there will be polarization. Leakage of components, resulting in polarization aliasing of heterodyne interference signals, resulting in non-linear errors in measurement results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking
  • Multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking
  • Multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0027] The "femtosecond optical comb" is produced by a femtosecond mode-locked laser, which is represented as a series of femtosecond laser periodic pulse sequences in the time domain, and the repetition frequency of the femtosecond pulse sequence at this time is f r and carrier envelope frequency shift f o They are all locked to microwave frequency standards, such as atomic clocks; in the frequency domain, they are broadband discrete spectrums with equal frequency intervals. These spectrums extend to both sides with the carrier frequency as the center, like a scale on a frequency ruler, and the smallest scale is the frequency interval f r , the spectral range can reach one optical octave, and each spectral line can be directly traced to the microwave frequency reference. Multi-wavelength interference absolute ranging is developed on...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The present invention provides a multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking. The multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking comprises: a multi-wavelength generator on the basis of the femtosecond optical comb synchronization frequency locking configured to emit a plurality of high-frequency stable object wavelength lasers; a heterodyne interferometer configured to receive lasers outputted by the multi-wavelength generator after the femtosecond optical comb synchronization frequency locking, returning measurement light and reference light after generation of interference through the heterodyne interferometer being coupled in single mode fibers by lens focusing to form mixed multi-wavelength heterodyne interference signals; and a synchronization phase demodulation module configured to separate the mixed multi-wavelength heterodyne interference signals obtained by the heterodyne interferometer through wavelength demodulation to obtain interference signals corresponding to each wavelength and perform synchronization phase measurement processing of the interference signals corresponding to each wavelength to finally obtain an accurate absolute distance value. The multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking is high in traceability of values, high in measurement precision, large in non-fuzziness measuring range, fast in update rate and easy to measurement on site in real time, and is applicable to the fields of the industrial production, the equipment manufacture and the large-size precision measurement.

Description

technical field [0001] The invention mainly relates to the field of laser ranging, in particular to a multi-wavelength interference real-time absolute ranging device based on femtosecond optical comb synchronous frequency locking. Background technique [0002] Laser ranging is currently the most accurate distance measurement method and technology. Traditional ranging methods are mainly divided into two categories: laser incoherent measurement and interferometric measurement. The former has been widely used in space long-distance measurements such as observation and positioning of the earth and the moon, but limited by the electronic resolution capability, the measurement accuracy can only reach the order of mm. Although laser interferometry technology based on homodyne and heterodyne theory can achieve nanometer positioning accuracy, it has been relatively maturely applied in the field of precision engineering, but because its measurement principle is based on fringe counti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/36
CPCG01S17/36G01S17/34
Inventor 颜树华王国超林存宝罗玉昆胡青青魏春华杜志广厉泽环王恩龙
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products