Multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking

A distance measuring device and multi-wavelength technology, which is applied in measuring devices, radio wave measuring systems, electromagnetic wave re-radiation, etc., can solve problems such as nonlinear error of measurement results, polarization aliasing of heterodyne interference signals, and leakage of polarization components , to achieve the effect of real-time measurement and expanding the non-ambiguous measurement range of distance measurement
CN105589074AInactive Publication Date: 2016-05-18NAT UNIV OF DEFENSE TECH
8 Cites 42 Cited by

Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Applications(China)
Current Assignee / Owner
NAT UNIV OF DEFENSE TECH
Publication Date
2016-05-18
Estimated Expiration
Not applicable ยท inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The present invention provides a multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking. The multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking comprises: a multi-wavelength generator on the basis of the femtosecond optical comb synchronization frequency locking configured to emit a plurality of high-frequency stable object wavelength lasers; a heterodyne interferometer configured to receive lasers outputted by the multi-wavelength generator after the femtosecond optical comb synchronization frequency locking, returning measurement light and reference light after generation of interference through the heterodyne interferometer being coupled in single mode fibers by lens focusing to form mixed multi-wavelength heterodyne interference signals; and a synchronization phase demodulation module configured to separate the mixed multi-wavelength heterodyne interference signals obtained by the heterodyne interferometer through wavelength demodulation to obtain interference signals corresponding to each wavelength and perform synchronization phase measurement processing of the interference signals corresponding to each wavelength to finally obtain an accurate absolute distance value. The multi-wavelength interference real-time absolute distance measurement device on the basis of femtosecond optical comb synchronization frequency locking is high in traceability of values, high in measurement precision, large in non-fuzziness measuring range, fast in update rate and easy to measurement on site in real time, and is applicable to the fields of the industrial production, the equipment manufacture and the large-size precision measurement.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention mainly relates to the field of laser ranging, in particular to a multi-wavelength interference real-time absolute ranging device based on femtosecond optical comb synchronous frequency locking. Background technique

[0002] Laser ranging is currently the most accurate distance measurement method and technology. Traditional ranging methods are mainly divided into two categories: laser incoherent measurement and interferometric measurement. The former has been widely used in space long-distance measurements such as observation and positioning of the earth and the moon, but limited by the electronic resolution capability, the measurement accuracy can only reach the order of mm. Although laser interferometry technology based on homodyne and heterodyne theory can achieve nanometer positioning accuracy, it has been relatively maturely applied in the field of precision engineering, but because its measurement principle is based on fringe counti...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More