Manufacturing method of semiconductor integrated circuit dual voltage comparator module
A dual-voltage comparator, integrated circuit technology, which is applied in semiconductor/solid-state device manufacturing, semiconductor devices, circuits, etc., can solve the problems of large size, complex production, and inability to meet quantitative production of comparators, achieving small size and simple operation. , The production process of the product is more scientific and practical
Active Publication Date: 2018-08-31
HUADONG PHOTOELECTRIC TECHN INST OF ANHUI PROVINCE
View PDF3 Cites 0 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0004] The purpose of the present invention is to provide a semiconductor integrated circuit dual-voltage comparator module manufacturing method, the semiconductor integrated circuit dual-voltage comparator module manufacturing method overcomes the comparator in the prior art, which is bulky, complicated to manufacture, and cannot meet the problem of quantitative production , to achieve the purpose of quantifying the production of voltage comparators
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0039] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only used to illustrate and explain the present invention, and not to limit the present invention.
[0040] The invention provides a method for manufacturing a semiconductor integrated circuit dual voltage comparator module. The manufacturing method for the semiconductor integrated circuit dual voltage comparator module includes:
[0041] Step 1. Weld the housing 1 and the cover plate 3 of the semiconductor integrated circuit dual voltage comparator module, sinter and fix the lead column on the housing 1, and plate the housing 1, the cover plate 3 and the lead column with gold;
[0042] Step 2: Fabricate a ceramic plate base of a semiconductor integrated circuit dual-voltage comparator, and the wires on the ceramic plate base are plated with a layer of gold;
[0043] Step 3: Cl...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention discloses a method for manufacturing a semiconductor integrated circuit dual-voltage comparator module, which includes: welding the casing (1) and the cover plate (3) of the semiconductor integrated circuit dual-voltage comparator module, and sintering and fixing the lead pipe column on the casing (1), And carry out gold-plating at shell (1), cover plate (3) and lead pipe column; Make the ceramic plate base of semiconductor integrated circuit double voltage comparator, the wire on the said ceramic plate base is plated one layer of gold layer; Clean The ceramic plate base, the shell (1) and the cover plate (3); the ceramic plate base is bonded on the shell (1); a layer of black glue is coated on the pad of the ceramic plate base, And the required chip of making semiconductor integrated circuit double voltage comparator is pasted on the welding pad coated with a layer of black glue on the ceramic board base; the chip and the ceramic substrate base (2 ) for capping. The invention realizes the purpose of quantitatively producing the voltage comparator.
Description
Technical field [0001] The present invention relates to the technical field of circuit design, in particular to a method for manufacturing a semiconductor integrated circuit dual voltage comparator module. Background technique [0002] With the continuous advancement of science and technology, a wide variety of circuits have been designed, including temperature control circuits, voltage stabilization circuits, liquid level detection circuits, battery charging circuits, etc. These circuits will involve relatively large voltages and will be used A voltage comparator. [0003] Comparators manufactured by the existing voltage comparator modules are bulky and complex, and cannot meet the purpose of quantitative production. Therefore, designing a voltage comparator module suitable for quantitative production becomes an urgent problem to be solved. Summary of the invention [0004] The purpose of the present invention is to provide a method for manufacturing a semiconductor integrated cir...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/50H01L21/60
CPCH01L21/50H01L24/83H01L2224/48247H01L2924/19107
Inventor 汪宁洪火锋何宏玉俞昌忠
Owner HUADONG PHOTOELECTRIC TECHN INST OF ANHUI PROVINCE